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Showing items 383381-383405 of 2349128 (93966 Page(s) Totally) << < 15331 15332 15333 15334 15335 15336 15337 15338 15339 15340 > >> View [10|25|50] records per page
| 國立臺灣大學 |
2006 |
Ellipsoid aMAPRM中間軸偵測與Voronoi邊界取樣之機器人路徑規劃應用
|
陳任志; Chen, Jerry |
| 國立臺灣海洋大學 |
2005 |
Ellipsometer Surface Plasma Resonance
|
W. L. Hsu;S. S. Lee;N. Z. Huang;Y. W. Chen;Y. W. Chan;C. K. Lee;W. R. Lai;Y. H. Chen |
| 國立臺灣大學 |
2005-07 |
Ellipsometer surface plasma resonance
|
Hsu, W.L.; Lee, S.S.; Huang, N.Z.; Chen, Y.W.; Chan, Y.W.; Lee, C.K.; Lai, W.R.; Chen, Y.H. |
| 臺大學術典藏 |
2020-04-28T07:12:28Z |
Ellipsometer surface plasma resonance
|
Hsu, W.L.; Lee, S.S.; Huang, N.Z.; Chen, Y.W.; Chan, Y.W.; Lee, C.K.; Lai, W.R.; Chen, Y.H.; CHIH-KUNG LEE |
| 國立成功大學 |
2007-09 |
Ellipsometric advances for local surface plasmon resonance to determine chitosan adsorption on layer-by-layer gold nanoparticles
|
Su, Yen Hsun; Teoh, Lay Gaik; Lai, Wei Hao; Chang, Shih-Hui; Yang, Hui-Chia; Hon, Min-Hsiung |
| 國立成功大學 |
2007-09 |
Ellipsometric Advances for Local Surface Plasmon Resonance to Determine Chitosan Adsorption on Layer-by-Layer Gold Nanoparticles
|
Su,�Yen�Hsun; �Teoh, �Lay-�Gaik; �Lai,� Wei-�Hao; �Chang,� Shih-Hui; �Yang,� Hui-Chia; Hon, �Min-�Hsiung |
| 國立交通大學 |
2014-12-08T15:03:12Z |
ELLIPSOMETRIC MEASUREMENTS AND ITS ALIGNMENT - USING THE INTENSITY RATIO TECHNIQUE
|
CHAO, YF; WEI, CS; LEE, WC; LIN, SC; CHAO, TS |
| 國立成功大學 |
2009-02 |
Ellipsometric Studies of Optical Properties of Local Surface Plasmon Resonance for Au Nanoparticles on the Substrate
|
Su, Yen Hsun; Chang, Shih-Hui; Teoh, Lay Gaik; Tu, Sheng-Lung; Hon, Min-Hsiung |
| 國立臺灣科技大學 |
1999 |
Ellipsometric Study of Carbon Nitride Thin Films with and without Silicon Addition
|
L. C. Chen;H. Y. Lin;C. S. Wong;K. H. Chen;S. T. Lin;Y. C. Yu;C. W. Wang;E. K. Lin |
| 國立臺灣大學 |
1999-01 |
Ellipsometric Study of Carbon Nitride Thin Films with and without Silicon Addition
|
Chen, L. C.; Lin, H. Y.; Wong, C. S.; Chen, K. H.; Lin, S. T.; Yu, Y. C.; Wang, C. W.; Ling, K. C.; Lin, E. K. |
| 臺大學術典藏 |
2020-01-06T03:11:09Z |
Ellipsometric study of carbon nitride thin films with and without silicon addition
|
Chen, L. C.; Lin, H. Y.; Wong, C. S.; Chen, K. H.; Lin, S. T.; Yu, Y. C.; Wang, C. W.; Lin, E. K.; Ling, K. C.; SHIANG-TAI LIN |
| 臺大學術典藏 |
2022-08-09T03:50:54Z |
Ellipsometric study of carbon nitride thin films with and without silicon addition
|
Chen L.C.; Lin H.Y.; Wong C.S.; Chen K.H.; Lin S.T.; Yu Y.C.; Wang C.W.; Lin E.K.; Ling K.C.; Chen L.C.; Lin H.Y.; Wong C.S.; Chen K.H.; Lin S.T.; Yu Y.C.; Wang C.W.; Lin E.K.; Ling K.C.; LI-CHYONG CHEN |
| 國立臺灣海洋大學 |
2009-04-13 |
Ellipsometric surface plasmon resonance
|
Wei-Liang Hsu;Shu-Sheng Lee;Chih-Kung Lee |
| 臺大學術典藏 |
2020-04-28T07:12:16Z |
Ellipsometric surface plasmon resonance
|
Hsu, W.-L.;Lee, S.-S.;Lee, C.-K.; Hsu, W.-L.; Lee, S.-S.; Lee, C.-K.; CHIH-KUNG LEE |
| 國立交通大學 |
2014-12-08T15:05:38Z |
ELLIPSOMETRY MEASUREMENT OF THE COMPLEX REFRACTIVE-INDEX AND THICKNESS OF POLYSILICON THIN-FILMS
|
HO, JH; LEE, CL; LEI, TF; CHAO, TS |
| 國立交通大學 |
2014-12-08T15:05:32Z |
ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMS
|
HO, JH; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:06:03Z |
ELLIPSOMETRY MEASUREMENTS ON SIO2-FILMS FOR THICKNESSES UNDER 200-A
|
HO, JH; LEE, CL; JEN, CW; LEI, TF |
| 國立臺灣海洋大學 |
2011-08 |
Ellipsometry study on gold-nanoparticle-coated gold thin film for biosensing application
|
Pei-Kuen Wei; Rakesh Singh Moirangthem; Yia-Chung Chang |
| 國立交通大學 |
2014-12-08T15:04:37Z |
ELLIPSOMETRY STUDY ON REFRACTIVE-INDEX PROFILES OF THE SIO2/SI3N4/SIO2/SI STRUCTURE
|
TIEN, SC; CHUNG, LL; TAN, FL |
| 國立交通大學 |
2015-12-02T02:59:34Z |
Elliptic and parabolic equations in fractured media
|
Yeh, Li-Ming |
| 國立交通大學 |
2014-12-08T15:07:33Z |
Elliptic equations in highly heterogeneous porous media
|
Yeh, Li-Ming |
| 國立交通大學 |
2014-01-28 |
Elliptic flow from thermal photons with magnetic field in holography
|
Mueller, Berndt; Wu, Shang-Yu; Yang, Di-Lun |
| 臺大學術典藏 |
2019-09-09T00:44:32Z |
Elliptic Flow of Charm and Strange Hadrons in High-Multiplicity p+Pb Collisions at sNN =8.16 TeV
|
Vannerom, D.;Fagot, A.;Moortgat, S.;Trocino, D.;Escalante Del Valle, A.;Goldouzian, R.;Taurok, A.;Bakhshiansohi, H.;Khvastunov, I.;Rad, N.;De Lentdecker, G.;Cornelis, T.;Rohringer, H.;Spanring, M.;De Bruyn, I.;Wittmann, J.;Beghin, D.;Postiau, N.;Bergauer, T.;Lauwers, J.;Madlener, T.;Krammer, N.;Sirunyan, A. M.;Starling, E.;Van Mechelen, P.;Schieck, J.;Tytgat, M.;Adam, W.;Suarez Gonzalez, J.;Tavernier, S.;Flechl, M.;Hrubec, J.;Van Haevermaet, H.;Lontkovskyi, D.;Ambrogi, F.;Kalsi, A. K.;Fasanella, G.;Vanlaer, P.;Tumasyan, A.;Lenzi, T.;De Clercq, J.;Dobur, D.;Thomas, L.;Favart, L.;Chekhovsky, V.;Bondu, O.;Verbeke, W.;Pieters, M.;Waltenberger, W.;Asilar, E.;Marchesini, I.;Skovpen, K.;Blekman, F.;Poyraz, D.;Mikulec, I.;Van De Klundert, M.;Clerbaux, B.;Python, Q.;Zaganidis, N.;Erö, J.;Liko, D.;Van Doninck, W.;Flouris, G.;Brandstetter, J.;Moreels, L.;Ghete, V. M.;De Wolf, E. A.;Gul, M.;Roskas, C.;Abu Zeid, S.;Zarucki, M.;Krätschmer, I.;Janssen, X.;Brondolin, E.;Mossolov, V.;Grebenyuk, A.;Brun, H.;Bilin, B.;Wang, Q.;Delannoy, H.;Frühwirth, R.;Deroover, K.;Brochet, S.;Luetic, J.;Dragicevic, M.;Dorney, B.;D'Hondt, J.;Schöfbeck, R.;Jeitler, M.;Di Croce, D.;Wulz, C. E.;Lowette, S.;Vit, M.;Van Parijs, I.;Bruno, G.;Vermassen, B.;Van Mulders, P.;Van Remortel, N.;Vander Velde, C.;Spitzbart, D.; Spitzbart, D.; Vander Velde, C.; Van Remortel, N.; Van Mulders, P.; Vermassen, B.; Bruno, G.; Van Parijs, I.; Vit, M.; Lowette, S.; Wulz, C. E.; Di Croce, D.; Jeitler, M.; Schöfbeck, R.; D'Hondt, J.; Dorney, B.; Dragicevic, M.; Luetic, J.; Brochet, S.; Deroover, K.; Frühwirth, R.; Delannoy, H.; Wang, Q.; Bilin, B.; Brun, H.; Grebenyuk, A.; Mossolov, V.; Brondolin, E.; Janssen, X.; Krätschmer, I.; Zarucki, M.; Abu Zeid, S.; Roskas, C.; Gul, M.; De Wolf, E. A.; Ghete, V. M.; Moreels, L.; Brandstetter, J.; Flouris, G.; Van Doninck, W.; Liko, D.; Erö, J.; Zaganidis, N.; Python, Q.; Clerbaux, B.; Van De Klundert, M.; Mikulec, I.; Poyraz, D.; Blekman, F.; Skovpen, K.; Marchesini, I.; Asilar, E.; Waltenberger, W.; Pieters, M.; Verbeke, W.; Bondu, O.; Chekhovsky, V.; Favart, L.; Thomas, L.; Dobur, D.; De Clercq, J.; Lenzi, T.; Tumasyan, A.; Vanlaer, P.; Fasanella, G.; Kalsi, A. K.; Ambrogi, F.; Lontkovskyi, D.; Van Haevermaet, H.; Hrubec, J.; Flechl, M.; Tavernier, S.; Suarez Gonzalez, J.; Adam, W.; Tytgat, M.; Schieck, J.; Van Mechelen, P.; Starling, E.; Sirunyan, A. M.; Krammer, N.; Madlener, T.; Lauwers, J.; Bergauer, T.; Postiau, N.; Beghin, D.; Wittmann, J.; De Bruyn, I.; Spanring, M.; Rohringer, H.; Cornelis, T.; De Lentdecker, G.; Rad, N.; Khvastunov, I.; Bakhshiansohi, H.; Taurok, A.; Goldouzian, R.; Escalante Del Valle, A.; Trocino, D.; Moortgat, S.; Fagot, A.; Vannerom, D.; KAI-FENG CHEN |
| 臺大學術典藏 |
2020-01-15T07:03:47Z |
Elliptic Flow of Charm and Strange Hadrons in High-Multiplicity p+Pb Collisions at sNN =8.16 TeV
|
Sirunyan, A.M.; Sirunyan, A.M.; KAI-FENG CHEN et al. |
| 臺大學術典藏 |
2018-09-10T18:06:36Z |
Elliptic flow of charm and strange hadrons in high-multiplicity pPb collisions at $\\sqrts__\\mathrmNN =$ 8.16 TeV
|
Stathes Paganis; Sirunyan, Albert M and others |
Showing items 383381-383405 of 2349128 (93966 Page(s) Totally) << < 15331 15332 15333 15334 15335 15336 15337 15338 15339 15340 > >> View [10|25|50] records per page
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