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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
臺大學術典藏 2018-09-10T15:26:38Z Measuring Preferences for a Diabetes Pay-for-Performance for Patient (P4P4P) Program using a Discrete Choice Experiment Chen, T.-T. ; Tung, T.-H. ; Hsueh, Y.-S. ; Tsai, M.-H. ; Liang, H.-M. ; Li, K.-L. ; Chung, K.-P. ; Tang, C.-H.; KUO-PIAO CHUNG
元培科技大學 2005 Measuring Process Capability Based on Cpk with Gauge Measurement Errors. Pearn; W. L. and Liao; M. Y.
國立交通大學 2014-12-08T15:13:35Z Measuring process capability based on Cpmk with gauge measurement errors Hsu, B. M.; Shu, M. H.; Pearn, W. L.
正修科技大學 2006-04-00 Measuring Process Capability Based on Cpmk with Gauge Measurement Errors 許碧敏
淡江大學 2013-07 Measuring Process Capital from a System Model Perspective Shang, Shari S.-C.; Wu, Ya-Ling
國立政治大學 2013-07 Measuring process capital from a system model perspective Shang, Shari S.C.;Wu, Y.-L.; 尚孝純
國立臺灣科技大學 2006 Measuring process performance based on expected loss for asymmetric tolerances Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
國立交通大學 2014-12-08T15:15:20Z Measuring process performance based on expected loss with asymmetric tolerances Pearn, W. L.; Chang, Y. C.; Wu, Chien-Wei
國立臺灣科技大學 2010 Measuring process performance based on Taguchi capability index in the presence of measurement errors Wu, Chien-Wei
國立交通大學 2014-12-08T15:39:50Z Measuring process yield based on the capability index C-pm Pearn, WL; Lin, PC
國立臺灣科技大學 2010 Measuring process yield by fuzzy lower confidence bounds Wu, Chien-Wei; Liao, M. Y.
國立臺灣科技大學 2013 Measuring process yield for nonlinear profiles Wang, F.-K.;Guo, Y.-C.
國立臺灣科技大學 2013 Measuring process yield for nonlinear profiles Wang, F.-K.;Guo, Y.-C.
國立臺灣科技大學 2014 Measuring process yield for nonlinear profiles Wang, F.-K.;Guo, Y.-C.
國立臺灣海洋大學 2011-06-06 Measuring production and consumption efficiencies using the SBM-NDEA approach: the case of low-cost carriers Yu-Chun Chang;Ming-Miin Yu
國立臺灣海洋大學 2014-01 Measuring production and consumption efficiencies using the slack-based measure network data envelopment analysis approach: the case of low-cost carriers Yu-Chun Chang;Ming-Miin Yu
國立臺灣大學 1993 Measuring Production Efficiency in a Not-for-Profit Setting: An Extension Li, Shu-Hsing; Mensah, Yaw M.
臺大學術典藏 2018-09-10T04:36:59Z Measuring Production Efficiency in a Not-for-Profit Setting: An Extension Shu-Hsing Li;Yaw M. Mensah; Shu-Hsing Li; Yaw M. Mensah; SHU-HSING LI
國立交通大學 2014-12-08T15:17:17Z Measuring production performance of different product mixes in semiconductor fabrication Chung, Shu-Hsing; Pearn, Wen Lea; Lee, Amy H. I.
中華大學 2006 Measuring production performance of different product mixes in semiconductor fabrication 李欣怡; Lee, Amy Hsin-I
國立交通大學 2014-12-08T15:07:43Z Measuring production yield for processes with multiple characteristics Pearn, W. L.; Cheng, Ya-Ching
國立交通大學 2014-12-08T15:15:29Z Measuring production yield for processes with multiple quality characteristics Pearn, W. L.; Wang, F. K.; Yen, C. H.
國立臺灣科技大學 2006 Measuring production yield for processes with multiple quality characteristics Pearn, W. L. ; Wang, F. K. ; Yen, C. H.
國立臺灣海洋大學 2011-10 Measuring productivity growth and biased technology change in Chinese airports Yu-Chun Chang;Ming-Miin Yu
國立臺灣海洋大學 2011 Measuring productivity growth and biased technology change in Chinese airports Yu-Chun Chang; 張玉君

Showing items 571991-572015 of 2348609  (93945 Page(s) Totally)
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