|
|
???tair.name??? >
???browser.page.title.title???
|
Showing items 641196-641220 of 2314001 (92561 Page(s) Totally)
<< < 25643 25644 25645 25646 25647 25648 25649 25650 25651 25652 > >>
View [10|25|50] records per page
| 臺大學術典藏 |
2020-02-14T03:18:13Z |
Oxidative transformation of N-substituted 2-aminophenols to 2-substituted benzoxazoles catalyzed by polymer-incarcerated and carbon-stabilized platinum nanoclusters
|
Woo-Jin Yoo; Hao Yuan; Hiroyuki Miyamura; Shū Kobayashi |
| 國家衛生研究院 |
2023-06-22 |
Oxidative/nitrative stress biomarkers increased the risk of recurrent pregnancy loss
|
Huang, PC;Lin, YJ;Kuo, PL |
| 國家衛生研究院 |
2023-12 |
Oxidative/nitrosative stress increased the risk of recurrent pregnancy loss–Taiwan Recurrent Pregnancy Loss and Environmental Study (TREPLES)
|
Lin, YJ;Chang, WH;Kuo, PL;Chen, HC;Chang, WT;Huang, PC |
| 國立成功大學 |
2023 |
Oxidative/nitrosative stress increased the risk of recurrent pregnancy loss–Taiwan Recurrent Pregnancy Loss and Environmental Study (TREPLES)
|
Lin, Y.-J.;Chang, W.-H.;Kuo, P.-L.;Chen, H.-C.;Chang, W.-T.;Huang, P.-C. |
| 中山醫學大學 |
2010-03 |
Oxidatively damaged DNA induced by humic acid and arsenic in maternal and neonatal mice
|
CW, Hu; CC, Yen; YL, Huang; CH, Pan; FJ, Lu; MR, Chao |
| 中山醫學大學 |
2010-03 |
Oxidatively damaged DNA induced by humic acid and arsenic in maternal and neonatal mice.
|
Hu CW;Yen CC;Huang YL;Pan CH;Lu FJ;Chao MR |
| 國立交通大學 |
2014-12-08T15:06:02Z |
OXIDE CONDUCTIVE COATED CATHODES FOR A SEALED-OFF CO2-LASER
|
HSIEH, TC; LAN, YL |
| 國立成功大學 |
2003-05 |
Oxide confined collector-up heterojunction bipolar transistors
|
Chen, Wen-Bin; Su, Yan-Kuin; Lin, Chun-Liang; Wang, Hsin-Chuan; Su, Juh-Yuh; Wu, Meng-Chi; Chen, Shi-Ming; Chen, Hong-Ren |
| 國立成功大學 |
2003-08 |
Oxide degradation mechanism in stacked-gate flash memory using the cell array stress test
|
Tsai, Shih-Hung; Hung, Jui-Sheng; Wang, Na-Fu; Horng, Jui-Hong; Houng, Mau-Phon; Wang, Yeong-Her |
| 國立東華大學 |
2005-05 |
Oxide Films of Multi-Element FeCoNiCrCuAl0.5 Alloy by Reactive DC Sputtering
|
Wong,M.S.; Chen,T.K. |
| 國立交通大學 |
2014-12-08T15:17:51Z |
Oxide grown on polycrystal silicon by rapid thermal oxidation in N2O
|
Kao, CH; Lai, CS; Lee, CL |
| 國立交通大學 |
2017-04-21T06:55:59Z |
Oxide Heteroepitaxy for Flexible Optoelectronics
|
Bitla, Yugandhar; Chen, Ching; Lee, Hsien-Chang; Do, Thi Hien; Ma, Chun-Hao; Van Qui, Le; Huang, Chun-Wei; Wu, Wen-Wei; Chang, Li; Chiu, Po-Wen; Chu, Ying-Hao |
| 國立交通大學 |
2019-09-02T07:46:18Z |
Oxide Heteroepitaxy-Based Flexible Ferroelectric Transistor
|
Tsai, Meng-Fu; Jiang, Jie; Shao, Pao-Wen; Lai, Yu-Hong; Chen, Jhih-Wei; Ho, Sheng-Zhu; Chen, Yi-Chun; Tsai, Din-Ping; Chu, Ying-Hao |
| 國立成功大學 |
2019 |
Oxide Heteroepitaxy-Based Flexible Ferroelectric Transistor
|
Tsai, M.-F.;Jiang, Jiang J.;Shao, P.-W.;Lai, Y.-H.;Chen, J.-W.;Ho, S.-Z.;Chen, Y.-C.;Tsai, D.-P.;Chu, Y.-H. |
| 國立交通大學 |
2014-12-08T15:24:27Z |
Oxide interfaces: pathways to novel phenomena
|
Yu, Pu; Chu, Ying-Hao; Ramesh, Ramamoorthy |
| 國立中山大學 |
2007-06 |
Oxide Islands Design for Elimination of Ultra-shallow Junction Formation
|
Jyi-Tsong Lin;Yi-Chuen Eng |
| 大葉大學 |
2015-12-18 |
Oxide layer in metal-oxide-semiconductor field effect transistor and its effect on threshold voltage
|
Fan, Jung-Chuan;Lee, Tsung-Che;Lee, Li-Ying;Lee, Shih-Fong |
| 大葉大學 |
2016-07-11 |
Oxide layer in metal-oxide-semiconductor field effect transistor and its effect on threshold voltage
|
Fan, Jung-Chuan;Lee, Shih-Fong |
| 國立成功大學 |
2009-11-18 |
Oxide mediated liquid-solid growth of high aspect ratio aligned gold silicide nanowires on Si(110) substrates
|
Bhatta, Umananda M.; Rath, Ashutosh; Dash, Jatis K.; Ghatak, Jay; Lai Yi-Feng; Liu, Chuan-Pu; Satyam, P. V. |
| 臺大學術典藏 |
1990-07 |
Oxide Resistance Characterization in MOS structures by the Voltage Decay Method
|
Hwu, Jenn-Gwo; Ho, I-Hsiu; Hwu, Jenn-Gwo; Ho, I-Hsiu |
| 國立臺灣大學 |
1990-07 |
Oxide Resistance Characterization in MOS structures by the Voltage Decay Method
|
Hwu, Jenn-Gwo; Ho, I-Hsiu |
| 臺大學術典藏 |
2018-09-10T04:13:01Z |
Oxide roughness effect on tunneling current of MOS diodes
|
Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W.; CHEE-WEE LIU |
| 國立臺灣大學 |
2002 |
Oxide roughness effect on tunneling current of MOS diodes
|
Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W. |
| 臺大學術典藏 |
2018-09-10T03:48:04Z |
Oxide roughness enhanced reliability of MOS tunneling diodes
|
Lin, C.-H.; Lee, M.H.; Hsu, B.-C.; Chen, K.-F.; Shie, C.-R.; Liu, C.W.; CHEE-WEE LIU |
| 國立臺灣大學 |
2001-12 |
Oxide roughness enhanced reliability of MOS tunneling diodes
|
Lin, C.H.; Lee, M.H.; Hsu, B.C.; Chen, K.F.; Shie, C.R.; Liu, C.W. |
Showing items 641196-641220 of 2314001 (92561 Page(s) Totally)
<< < 25643 25644 25645 25646 25647 25648 25649 25650 25651 25652 > >>
View [10|25|50] records per page
|
