元智大學 |
2007-08 |
Reliability Assessment of Sn-Pb and Pb-free Solder Joints under the Cyclic Bend and Shear Tests
|
陳永樹; Wang Ching-Shun; Fan Chentse; Chang Kuo-Chin; Pu Han-Ping |
國立成功大學 |
2012-09-01 |
Reliability assessment of ultra-thin HfO2 films deposited on silicon wafer
|
Fu, Wei-En; Chang, Chia-Wei; Chang, Yong-Qing; Yao, Chih-Kai; Liao, Jiunn-Der |
臺大學術典藏 |
2020-05-15T07:01:41Z |
Reliability assessment on earthquake early warning: A case study from Taiwan
|
Xu, Y.;Wang, J.P.;Wu, Y.-M.;Kuo-Chen, H.; Xu, Y.; Wang, J.P.; Wu, Y.-M.; Kuo-Chen, H.; YIH-MIN WU |
臺大學術典藏 |
2022-06-30T02:05:25Z |
Reliability assessment on earthquake early warning: A case study from Taiwan
|
Xu Y.; Wang J.P.; Wu Y.-M.; Kuo-Chen H.; Xu Y.; Wang J.P.; Wu Y.-M.; Kuo-Chen H.; HAO KUO-CHEN |
淡江大學 |
2000-08 |
Reliability based optimum structural design for robust performance using fuzzy formulation strategy
|
Shih, C. J.; Tseng, T. J. |
國立成功大學 |
2020-10 |
Reliability Characteristics of Diamond-Like Carbon as Gate Insulator for Metal-Insulator-Semiconductor Application
|
Tyan;S, -L.;Tang;H, -C.;Wu;Z, -W.;Mo;T, -S. |
國立成功大學 |
2020 |
Reliability Characteristics of Diamond-Like Carbon as Gate Insulator for Metal–Insulator–Semiconductor Application
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Tyan, S.-L.;Tang, H.-C.;Wu, Z.-W.;Mo, T.-S. |
國立交通大學 |
2014-12-08T15:12:18Z |
Reliability characteristics of NiSi nanocrystals embedded in oxide and nitride layers for nonvolatile memory application
|
Chen, Wei-Ren; Chang, Ting-Chang; Yeh, Jui-Lung; Sze, S. M.; Chang, Chun-Yen |
國立交通大學 |
2020-07-01T05:22:07Z |
Reliability Characterization of Gallium Nitride MIS-HEMT Based Cascode Devices for Power Electronic Applications
|
Elangovan, Surya; Cheng, Stone; Chang, Edward Yi |
國立臺灣科技大學 |
2013 |
Reliability consideration with rectangle- and double-signal through silicon vias insertion in 3D thermal-aware floorplanning
|
Hsu, C.-H.;Ruan, S.-J.;Chen, Y.-J.;Kan, T.-C. |
淡江大學 |
2016/01/12 |
Reliability curve fitting for aging helicopter components
|
James T. Luxhoj; Huan-Jyh Shyur |
亞洲大學 |
2018-04 |
RELIABILITY DEGRADATION FORMULA BASED ON THE SUBSYSTEMS OF THE GENERALIZED ARRANGEMENT GRAPH
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龔自良;KUNG, TZU-LIANG;* |
義守大學 |
2018-01 |
Reliability Design and Optimization Process on Through Mold Via Using Ultrafast Laser
|
Hsiang-Chen Hsu;Shih-Jeh Wu;Wen-Fei Lin;Boen Houng |
義守大學 |
2016-04 |
Reliability design on wearable device for initial osteoarthritis (OA) on knee joints
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Hsiang-Chen Hsu;Pin-Chieh Wang;Jia-Jung Wang;Shen-Li Fu |
嘉南藥理大學 |
2009 |
Reliability Engineering & System Safety
|
Elsevier SDOL |
朝陽科技大學 |
2019-01 |
Reliability Enhancement of Edge Computing Paradigm using Agreement
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王淑卿;熊維舒;謝佳奮;蔡耀德 |
元智大學 |
2013-12 |
Reliability Enhancement of Flash-Memory Storage Systems: An Efficient Version-Based Design
|
Yuan-Hao Chang; Pei-Han Hsu; Lue-Jane Lee; Tei-Wei Kuo; David Hung-Chang Du |
臺大學術典藏 |
2018-09-10T09:47:22Z |
Reliability enhancement of flash-memory storage systems: An efficient version-based design
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Chang, Y.-H.;Huang, P.-C.;Hsu, P.-H.;Lee, L.-J.;Kuo, T.-W.;Du, D.H.-C.; Chang, Y.-H.; Huang, P.-C.; Hsu, P.-H.; Lee, L.-J.; Kuo, T.-W.; Du, D.H.-C.; TEI-WEI KUO |
朝陽科技大學 |
2019-07-20 |
Reliability Enhancement of Mobile Edge Computing for the IoT with Multiple Damage Communication
|
王淑卿;熊維舒;謝佳奮 |
朝陽科技大學 |
2020 |
Reliability Enhancement of Mobile Edge Computing for the IoT with Multiple Damage Communication
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謝佳奮;王淑卿;熊維舒 |
臺大學術典藏 |
2018-09-10T08:18:38Z |
Reliability Enhancement With Network Coding for IEEE 802.16n Network (IEEE C802.16gman-10/0013)
|
Hung-Yu Wei;Ching-Chun Chou;Chun-Yen Wang;Yan-Xiu Zheng; Hung-Yu Wei; Ching-Chun Chou; Chun-Yen Wang; Yan-Xiu Zheng; HUNG-YU WEI |
國立臺灣大學 |
2005 |
Reliability estimation for dynamic systems subject to stochastic excitations using Subset Simulation with splitting
|
Ching, J.; Au, S.K.; Beck, J.L |
國立臺灣科技大學 |
2016 |
Reliability evaluation according to a routing scheme for multi-state computer networks under assured accuracy rate
|
Lin, Y.-K;Huang, C.-F. |
國立交通大學 |
2014-12-08T15:31:22Z |
Reliability evaluation and adjustment of supply chain network design with demand fluctuations
|
Hsu, Chaug-Ing; Li, Hui-Chieh |
國立臺灣科技大學 |
2002 |
Reliability Evaluation for A Capacitated-Flow Network with Time Attribute
|
Lin, Yi-Kuei |