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機構 日期 題名 作者
國立彰化師範大學 2000-07 X-ray Photoelectron Spectroscopy Study of (NH4)2Sx-treated Mg-doped GaN Layers Lin, Yow-Jon; Tsai, Chang-Da; Lyu, Yen-Tang; Lee, Ching-Ting
臺大學術典藏 2003 X-ray photoemission spectroscopy characterization of the electrode-ferroelectric interfaces in Pt/Bi4Ti3O12/Pt and Pt/Bi3.25La0.75Ti3O12/Pt capacitors: Possible influence of defect structure on fatigue properties Brohan, L.; Gautier, E.; Caldes, T.; Ganne, M.; Chu, M.-W.
臺大學術典藏 2020-03-31T08:25:14Z X-ray photoemission study in Re0.7Ca0.3 MnO 3 epitaxial films Hsu, D.; Mani, A.; Chuang, C. H.; Chen, C. H.; Lin, M. T.; Lin, J. G.
臺大學術典藏 2009-02 X-ray Photoemission Study in Re0.7Ca0.3MnO3 Epitaxial Films Lin, J. G.; Lin, Minn-Tsong; Chen, C. H.; Chuang, C. H.; Mani, Awadhesh; Hsu, Daniel; Hsu, Daniel; Mani, Awadhesh; Chuang, C. H.; Chen, C. H.; Lin, Minn-Tsong; Lin, J. G.
國立臺灣大學 2009 X-ray photoemission study in Re0.7Ca0.3MnO3 epitaxial films Hsu, Daniel; Mani, Awadhesh; Chuang, C. H.; Chen, C. H.; Lin, Minn-Tsong; Lin, J. G.
國立臺灣大學 2009-02 X-ray Photoemission Study in Re0.7Ca0.3MnO3 Epitaxial Films Hsu, Daniel; Mani, Awadhesh; Chuang, C. H.; Chen, C. H.; Lin, Minn-Tsong; Lin, J. G.
國立臺灣大學 1985 X-ray Polarization Ratio of Graphite Crystal Monochromator LUR, Water; Chen, R.; 盧火鐡; 陳瑞虹
國立交通大學 2014-12-08T15:43:22Z X-ray reflectivity and FTIR measurements of N-2 plasma effects on the density profile of hydrogen silsesquioxane thin films Lee, HJ; Lin, EK; Wu, WL; Fanconi, BM; Lan, JK; Cheng, YL; Liou, HC; Wang, YL; Feng, MS; Chao, CG
國立成功大學 2014-01 X-ray reflectivity and surface energy analyses of the physical and electrical properties of alpha-IGZO/GZO double active layer thin film transistors Wu, Jia-Ling; Lin, Han-Yu; Su, Bo-Yuan; Chen, Yu-Cheng; Chu, Sheng-Yuan; Liu, Ssu-Yin; Chang, Chia-Chiang; Wu, Chin-Jyi
國立臺灣海洋大學 2004-12-22 X-ray reflectivity study of the structural characteristics of BaTiO3/LaNiO3 superlattice Yuan-Chang Liang;Tai-Bor Wu;Hsin-Yi Lee;Heng-Jui Liu

顯示項目 921176-921185 / 2342286 (共234229頁)
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