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"余俊諺"

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Institution	Date	Title	Author
國立交通大學	2014-12-12T01:47:34Z	隨機缺陷在16奈米金屬閘高介電場效應電晶體特性影響之研究	余俊諺; Yiu, Chun-Yen; 李義明; Li, Yiming

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