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Taiwan Academic Institutional Repository >
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"胡振國"
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| 臺大學術典藏 |
2018-07-06T15:02:04Z |
Improvement in Radiation Hardness of Rapid Thermal Nitrided Oxides by Repeated Irradiation-Then-Anneal Treatments
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Lu, W. S.; Hwu, Jenn-Gwo; Lu, W. S.; 胡振國; Lu, W. S.; Hwu, Jenn-Gwo; Lu, W. S. |
| 臺大學術典藏 |
2018-07-06T15:02:04Z |
Improvement in Reliability of n-MOSFETs by Using Rapid Thermal N20- Reoxidized Gate Oxides
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Hwu, Jenn-Gwo; Wu, Y. L.; Wu, Z. Y.; 胡振國; Wu, Y. L.; Wu, Z. Y.; Hwu, Jenn-Gwo; Wu, Y. L.; Wu, Z. Y. |
| 臺大學術典藏 |
2018-07-05T02:38:44Z |
Reliable C-V Characterization of MOS Capacitors by Initial Treatment at the Presence of Slow Interface States
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Hwu, Jenn-Gwo; Wang, Way-Seen; Lin, J. J.; 胡振國; Lin, J. J.; 王維新; Hwu, Jenn-Gwo; Wang, Way-Seen |
| 國立交通大學 |
2014-12-13T10:40:11Z |
以含氮氧化矽閘極製程製作高穩定度矽金氧半元件
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胡振國; HWU JENN-GWO |
| 臺大學術典藏 |
2009-04-27T07:11:26Z |
Radiation Effects on the Oxide Properties of Silicon MOS Capacitor
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胡振國;Lee, G. S.;Jeng, M. J.;王維新;李嗣涔; Hwu, Jenn-Gwo;Lee, G. S.;Jeng, M. J.;Wang, Way-Seen;Lee, Si-Chen; 胡振國; Lee, G. S.; Jeng, M. J.; 王維新; 李嗣涔; Hwu, Jenn-Gwo; Lee, G. S.; Jeng, M. J.; Wang, Way-Seen; Lee, Si-Chen |
| 臺大學術典藏 |
2009-04-27T04:28:29Z |
Radiation Hardness of Coplanar Submicron Gap Charge-Coupled Devices (CCD) with Rapid Thermal Nitrided Oxides
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Lee, G. C.; Hwu, Jenn-Gwo; Lee, G. C.; 胡振國; Lee, G. C.; Hwu, Jenn-Gwo; Lee, G. C. |
| 臺大學術典藏 |
2009-04-27T04:27:06Z |
Radiation Hardness of Coplanar Submicron Gap Charge-Coupled Devices (CCD) with Rapid Thermal Nitrided Oxides
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Hwu, Jenn-Gwo; Lee, K. C.; 胡振國; Lee, K. C.; Hwu, Jenn-Gwo; Lee, K. C. |
| 臺大學術典藏 |
2009-02-24T03:49:30Z |
Clockwise C-V Hysteresis Phenomena of Metal-Tantalum Oxide-Silicon-Oxide-Silicon(P) Capacitors Due to Leakage Current Through Tantalum Oxide
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Tu, Y. K.; Wang, Way-Seen; Hwu, Jenn-Gwo; Hwu, Jenn-Gwo; Wang, Way-Seen; Tu, Y. K.; Jeng, M. J.; 胡振國; Jeng, M. J.; 王維新; Tu, Y. K. |
| 國立臺灣大學 |
2008-07-31 |
微電子工程學門研究發展及推動規劃(3/3)
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胡振國 |
| 國立臺灣大學 |
2008-07-31 |
先進CMOS元件及製程研究－總計畫(3/3)
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胡振國 |
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