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Institution	Date	Title	Author
臺大學術典藏	2019-07-02T05:23:35Z	Silicon Wafer Inspection Using Image Process Technology and Neural Network	張文亮; 張文亮;王朝興;謝炎達; 謝炎達; 王朝興
國立彰化師範大學	2007	類神經網路應用於晶圓探針痕之檢測	謝炎達

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