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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立中山大學 2009 In situ measurements of thermal and electrical effects of strain in flip-chip silicon dies using synchrotron radiation x-rays A.T. Wu;C.Y. Tsai;C.L. Kao;M.K. Shih;Y.S. Lai;H.Y. Lee;C.S. Ku

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