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Showing items 1-16 of 16  (1 Page(s) Totally)
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Institution Date Title Author
南台科技大學 2008 Evolution of the optical properties of Si nanoparticles embedded in SiO2 as function of annealing conditions 高至誠; I. Stenger; B. Gallas; L. Siozade; C. C. Kao; S. Chenot; S. Fisson; G. Vuye; J. Rivory
南台科技大學 2008 Annealing-induced evolution of Er doped SiOx film 高至誠; Chih-cheng Kao; B. Gallas; J. Rivory
南台科技大學 2007-12 Study of Erbium Doped Silica Films Containing Silicon Nanograins 高至誠; Chih-cheng Kao; B. Gallas; J. Rivory
南台科技大學 2006 Erbium dopes SiOx film : annealing-induced evolution on structural and optical properties 高至誠; C. C. Kao; B. Gallas; J. Rivory
南台科技大學 2006 Optical properties of silicon nanocrystal embedded in SiO2 thin films 高至誠; C. C. Kao; B. Gallas; J. Rivory
南台科技大學 2005 Optical properties of Si nanocrystals embedded in SiO2 高至誠; B. Gallas; I. Stenger; C.-C. Kao; S. Fisson; G. Vuye; J. Rivory
南台科技大學 2005 Correlation between Si-related and erbium photoluminescence bands and determination of erbium effective excitation cross section in SiO2 films 高至誠; C.-C. Kao; C. Barthou; B. Gallas; S. Fisson; G. Vuye; J. Rivory; A. Al Choueiry; A.-M. Jurdyc; Jacquier; L. Bigot
南台科技大學 2004 Dielectric function of Si nanocrystals embedded in SiO2 高至誠; B. Gallas; C.-C. Kao; C. efranoux; S. Fisson; G. Vuye; J. Rivory
南台科技大學 2004 Determination of effective absorption cross section of erbium in SiO2 films containing nc-Si 高至誠; C.-C. Kao; L. Bigot; A.-M. Jurdyc; B. Jacquier; B. Gallas; S. Fisson; G. Vuye; J. Rivory
南台科技大學 2004 Near band gap absorption of Si nanocrystals in SiO2 investigated by spectroscopic ellipsometry and photothermal deflection spectroscopy 高至誠; L. Siozade; I. Stenger; B. Gallas; C.-C. Kao; S. Fisson; G. Vuye; J. Rivory
南台科技大學 2003 In situ control of SiOx composition by spectroscopic ellipsometry 高至誠; B. Gallas; C.-C. Kao; S. Fission; G. Vuye; J. Rivory
南台科技大學 2003 Photoluminescence study of erbium doped SiO2 thin films containing Si nanocrystals 高至誠; C.-C. Kao; C. Bartou; B. Gallas; S. Fission; G. Vuye; J. Rivory
南台科技大學 2003 In situ control of SiOx stoechiometry by spectroscopic ellipsometry 高至誠; B. Gallas; C.-C. Kao; S. Fission; G. Vuye; J. Rivory
南台科技大學 2003 Dielectric function of Si dots embedded in SiO2 高至誠; B. Gallas; C.-C. Kao; C. Defranoux; S. Fission; G. Vuye; J. Rivory
南台科技大學 2003 Photoluminescence study of SiO2 thin films doped with Si nano-grains and erbium 高至誠; C.-C. Kao; C. Bartou; B. Gallas; S. Fission; G. Vuye; J. Rivory
南台科技大學 2002 Laser annealing of SiOx thin films 高至誠; B. Gallas; C.-C. Kao; S. Fission; G. Vuye; J. Rivory; Y. Bernard; C. Belouet

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