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Institution Date Title Author
臺大學術典藏 2018-09-10T08:18:10Z Effective Design-for-Testability Techniques for H.264 All-Binary Integer Motion Estimation P. Y. Yeh;B. Y. Ye;S. Y. Kuo; P. Y. Yeh; B. Y. Ye; S. Y. Kuo; SY-YEN KUO
臺大學術典藏 2018-09-10T08:18:10Z Effective Design-for-Testability Techniques for H.264 All-Binary Integer Motion Estimation P. Y. Yeh;B. Y. Ye;S. Y. Kuo; P. Y. Yeh; B. Y. Ye; S. Y. Kuo; SY-YEN KUO
臺大學術典藏 2018-09-10T07:41:49Z Scalable and bijective cells for C-testable iterative logic array architectures SY-YEN KUO; I. Y. Chen; P. Y. Yeh; S. Y. Kuo; B. Y. Ye; B. Y. Ye;P. Y. Yeh;S. Y. Kuo;I. Y. Chen
臺大學術典藏 2018-09-10T07:41:49Z Scalable and bijective cells for C-testable iterative logic array architectures SY-YEN KUO; I. Y. Chen; P. Y. Yeh; S. Y. Kuo; B. Y. Ye; B. Y. Ye;P. Y. Yeh;S. Y. Kuo;I. Y. Chen
臺大學術典藏 2018-09-10T07:41:49Z Design-for-Testability Techniques for Arithmetic Circuits B. Y. Ye;P. Y. Yeh;S. Y. Kuo;I. Y. Chen; B. Y. Ye; P. Y. Yeh; S. Y. Kuo; I. Y. Chen; SY-YEN KUO
臺大學術典藏 2018-09-10T07:41:49Z Design-for-Testability Techniques for Arithmetic Circuits B. Y. Ye;P. Y. Yeh;S. Y. Kuo;I. Y. Chen; B. Y. Ye; P. Y. Yeh; S. Y. Kuo; I. Y. Chen; SY-YEN KUO
臺大學術典藏 2018-09-10T07:41:48Z Design-for-Testability Techniques for CORDIC Design B. Y. Ye;P. Y. Yeh;S. Y. Kuo;I. Y. Chen; B. Y. Ye; P. Y. Yeh; S. Y. Kuo; I. Y. Chen; SY-YEN KUO
臺大學術典藏 2018-09-10T07:41:48Z Design-for-Testability Techniques for CORDIC Design B. Y. Ye;P. Y. Yeh;S. Y. Kuo;I. Y. Chen; B. Y. Ye; P. Y. Yeh; S. Y. Kuo; I. Y. Chen; SY-YEN KUO

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