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显示项目 26-37 / 37 (共1页)
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机构 日期 题名 作者
臺大學術典藏 2020-03-02T06:40:07Z Impact of integrating equipment health in production scheduling for semiconductor fabrication Kao, Y.-T.; Dauz?re-P?r?s, S.; Blue, J.; Chang, S.-C.; JAKEY BLUE
臺大學術典藏 2020-03-02T06:40:06Z The detection and the control of machine/chamber mismatching in semiconductormanufacturing Chouichi, A.; Blue, J.; Yugma, C.; Pasqualini, F.; JAKEY BLUE
臺大學術典藏 2020-03-02T06:40:06Z Virtual metrology modeling based on Gaussian Bayesian network Yang, W.-T.; Blue, J.; Roussy, A.; Reis, M.S.; Pinaton, J.; JAKEY BLUE
臺大學術典藏 2020-03-02T06:40:06Z Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing Rostami, H.; Blue, J.; Chen, A.; Yugma, C.; JAKEY BLUE
臺大學術典藏 2020-03-02T06:39:58Z Recipe-independent tool health indicator and fault prognosis Chen, A.; Blue, J.; Chou, T.-C.; Yang, T.-K.; ARGON CHEN
臺大學術典藏 2020-03-02T06:39:57Z Recipe-independent indicator for tool health diagnosis and predictive maintenance Chen, A.; Blue, J.; ARGON CHEN
臺大學術典藏 2020-03-02T06:39:56Z Optimum sampling for track PEB CD integrated metrology Chen, A.; Hsueh, S.; Blue, J.; ARGON CHEN
臺大學術典藏 2020-03-02T06:39:52Z Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing Rostami, H.; Blue, J.; Chen, A.; Yugma, C.; ARGON CHEN
臺大學術典藏 2017 Equipment condition diagnosis and fault fingerprint extraction in semiconductor manufacturing Rostami, H.; Blue, J.; Yugma, C.; JAKEY BLUE
臺大學術典藏 2013 Tool condition diagnosis with a recipe-independent hierarchical monitoring scheme Blue, J.; Gleispach, D.; Roussy, A.; Scheibelhofer, P.; JAKEY BLUE
國立臺灣大學 2007 Demand planning approaches to aggregating and forecasting interrelated demands for safety stock and backup capacity planning Chen, Argon; Hsu, C.-H.; Blue, J.
臺大學術典藏 2007 Demand planning approaches to aggregating and forecasting interrelated demands for safety stock and backup capacity planning Chen, Argon; Hsu, C.-H.; Blue, J.; Chen, Argon; Hsu, C.-H.; Blue, J.

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