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"brar v w"
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| 臺大學術典藏 |
2020-06-11T06:14:41Z |
Atomic-Scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Control
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Lin, W.-H.;Brar, V.W.;Jariwala, D.;Sherrott, M.C.;Tseng, W.-S.;Wu, C.-I.;Yeh, N.-C.;Atwater, H.A.; Lin, W.-H.; Brar, V.W.; Jariwala, D.; Sherrott, M.C.; Tseng, W.-S.; Wu, C.-I.; Yeh, N.-C.; Atwater, H.A.; CHIH-I WU |
| 臺大學術典藏 |
2020-06-11T06:14:41Z |
Atomic-Scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Control
|
Lin, W.-H.;Brar, V.W.;Jariwala, D.;Sherrott, M.C.;Tseng, W.-S.;Wu, C.-I.;Yeh, N.-C.;Atwater, H.A.; Lin, W.-H.; Brar, V.W.; Jariwala, D.; Sherrott, M.C.; Tseng, W.-S.; Wu, C.-I.; Yeh, N.-C.; Atwater, H.A.; CHIH-I WU |
Showing items 1-2 of 2 (1 Page(s) Totally)
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