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Institution Date Title Author
國立臺灣海洋大學 2004-09 Metal/GaN reaction chemistry and their electrical properties J. H. Je; C. C. Kim; S. K. Seol; J. K. Kim; J.-L. Lee; Y. Hwu; P. Ruterana; G. Magaritondo
國立臺灣海洋大學 2004-02 Coherent Microradiology observes a Critical Cathode-Anode Distance Effect in Localized Electrochemical Deposition (LECD) G. Margaritondo; S. K. Seol; J. M. Yi; x. Jin; C. C. Kim; J. H. Je; W. L. Tsai; P. C. Hsu; Y. Hwu; C. H. Chen; L. W. Chang
國立中山大學 2004 Coherent Microradiology observes a Critical Cathode-Anode Distance Effect in Localized Electrochemical Deposition (LECD) K. Seol;J.M. Yi;x. Jin;C.C. Kim;J.H. Je;W.L. Tsai;P.C. Hsu;Y. Hwu;C.H. Chen;L.W. Chang;G. Margaritondo

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