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總筆數 :2856708
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造訪人次 :
53606640
線上人數 :
1005
教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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"chiou bs"的相關文件
顯示項目 21-30 / 132 (共14頁)
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| 國立交通大學 |
2014-12-08T15:43:38Z |
Luminescent mechanisms of ZnS : Cu : Cl and ZnS : Cu : Al phosphors
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Chen, YY; Duh, JG; Chiou, BS; Peng, CG |
| 國立交通大學 |
2014-12-08T15:43:31Z |
Synthesis of Eu3+-activated yttrium oxysulfide red phosphor by flux fusion method
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Lo, CL; Duh, JG; Chiou, BS; Peng, CC; Ozawa, L |
| 國立交通大學 |
2014-12-08T15:43:06Z |
Novel chip standby current prediction model and ultrathin gate oxide scaling limit
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Su, HD; Chiou, BS; Lu, PC; Chang, MH; Lee, KH; Chao, CP; See, YC; Sung, JYC |
| 國立交通大學 |
2014-12-08T15:43:06Z |
Curing of polyimide and the effect of the TEOS SiO2 barrier layer on the electromigration of sputtered Cu with polyimide passivation
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Hung, HY; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:43:05Z |
Current-temperature characteristics of low-temperature-sputtered (Ba,Sr)TiO3 films post treated by rapid thermal annealing
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Shye, DC; Chen, JS; Kuo, MW; Chou, BCS; Jan, CK; Wu, MF; Chiou, BS; Cheng, HC |
| 國立交通大學 |
2014-12-08T15:43:00Z |
The effect of ZnS content on the luminescence and electrical properties of ZnO : Zn phosphor
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Lin, CH; Chiou, BS; Chang, CH; Lin, JD |
| 國立交通大學 |
2014-12-08T15:42:28Z |
Barrier layer effect of tantalum on the electromigration in sputtered copper films on hydrogen silsesguioxane and Si0(2)
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Sung, WL; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:42:26Z |
Effect of the tantalum barrier layer on the electromigration and stress migration resistance of physical-vapor-deposited copper interconnect
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Chin, YL; Chiou, BS; Wu, WF |
| 國立交通大學 |
2014-12-08T15:42:16Z |
Low-voltage cathodoluminescence properties of the Y2O2S : Eu red light emitting phosphor screen in field-emission environments
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Lo, CL; Duh, JG; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:41:51Z |
Microstructure characteristics for anorthite composite glass with nucleating agents of TiO2 under non-isothermal crystallization
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Lo, CL; Duh, JG; Chiou, BS; Lee, WH |
顯示項目 21-30 / 132 (共14頁)
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