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"chiou bs"的相關文件
顯示項目 36-45 / 132 (共14頁)
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| 國立交通大學 |
2014-12-08T15:41:08Z |
The effects of post excimer laser annealing on (Ba,Sr)TiO3 thin films at low substrate temperatures
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Shye, DC; Chiou, BS; Hwang, CC; Jaing, CC; Hsu, HW; Chen, JS; Cheng, HC |
| 國立交通大學 |
2014-12-08T15:41:07Z |
Dependence of polarization on temperature coefficient resistance of (Ba, Sr)TiO3 thin films post-treated by RTA
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Shye, DC; Chiou, BS; Kuo, MW; Chen, JS; Chou, BCS; Jan, CK; Wu, MF; Cheng, HC |
| 國立交通大學 |
2014-12-08T15:40:51Z |
A floating well method for exact capacitance-voltage measurement of nano technology
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Su, HD; Chiou, BS; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Chao, CP; See, YC; Sun, JYC |
| 國立交通大學 |
2014-12-08T15:40:26Z |
Characteristics of oxide breakdown and related impact on device of ultrathin (2.2 nm) silicon dioxide
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Su, HD; Chiou, BS; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Cha, CP; See, YC; Sun, JYC |
| 國立交通大學 |
2014-12-08T15:40:05Z |
Bi-mode breakdown test methodology of ultrathin oxide
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Su, HD; Chiou, BS; Ko, CY; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Chao, CP; See, YC; Sun, JYC |
| 國立交通大學 |
2014-12-08T15:40:02Z |
Effects of underlayer dielectric on the thermal characteristics and electromigration resistance of copper interconnect
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Chin, YL; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:39:46Z |
Effects of thermal stabilities for the ultra thin chromium layers applied on (Ba,Sr)TiO3 thin films
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Kuo, MW; Shye, DC; Chiou, BS; Chen, JS; Cheng, HC |
| 國立交通大學 |
2014-12-08T15:39:33Z |
The effects of surface-plasma treatment of thin-film hydrogen silesquioxane low k dielectric
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Chen, CT; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:39:33Z |
Effect of glass additions on the sintering behaviors and electrical microwave properties of BaO-Nd2O3-Sm2O3-TiO2 ceramics
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Chang, LC; Chiou, BS; Lee, WH |
| 國立交通大學 |
2014-12-08T15:39:26Z |
Electromigration in sputtered copper film on plasma-treated hydrogen silsesquioxane dielectric
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Chen, CT; Chiou, BS |
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