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Showing items 41-50 of 132  (14 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:40:02Z Effects of underlayer dielectric on the thermal characteristics and electromigration resistance of copper interconnect Chin, YL; Chiou, BS
國立交通大學 2014-12-08T15:39:46Z Effects of thermal stabilities for the ultra thin chromium layers applied on (Ba,Sr)TiO3 thin films Kuo, MW; Shye, DC; Chiou, BS; Chen, JS; Cheng, HC
國立交通大學 2014-12-08T15:39:33Z The effects of surface-plasma treatment of thin-film hydrogen silesquioxane low k dielectric Chen, CT; Chiou, BS
國立交通大學 2014-12-08T15:39:33Z Effect of glass additions on the sintering behaviors and electrical microwave properties of BaO-Nd2O3-Sm2O3-TiO2 ceramics Chang, LC; Chiou, BS; Lee, WH
國立交通大學 2014-12-08T15:39:26Z Electromigration in sputtered copper film on plasma-treated hydrogen silsesquioxane dielectric Chen, CT; Chiou, BS
國立交通大學 2014-12-08T15:38:56Z Effect of B2O3 nano-coating on the sintering behaviors and electrical microwave properties of Ba(Nd2-xSmx)Ti4O12 ceramics Chang, LC; Chiou, BS
國立交通大學 2014-12-08T15:38:51Z Electromigration and integration aspects for the copper-SiLK system Tseng, HS; Chiou, BS; Wu, WF; Ho, CC
國立交通大學 2014-12-08T15:36:45Z The effect of In2O3 conductive coating on the luminescence and zeta potential of ZnS : Cu, Al phosphors Chang, CH; Chiou, BS; Chen, KS; Ho, CC; Ho, JC
國立交通大學 2014-12-08T15:27:50Z FABRICATION AND CHARACTERISTICS OF RF MAGNETRON-SPUTTERED ITO THIN-FILMS WU, WF; CHIOU, BS
國立交通大學 2014-12-08T15:27:07Z Electromigration in sputtered copper interconnection with polyimide as interlevel dielectric or passivation Chiou, BS; Jiang, JS; Wang, HW; Hung, HY

Showing items 41-50 of 132  (14 Page(s) Totally)
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