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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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"chiou yih chih"的相關文件
顯示項目 36-60 / 74 (共3頁) << < 1 2 3 > >> 每頁顯示[10|25|50]項目
中華大學 |
2008 |
Taguchi Method for Parametric Appraisal of Wear on Micro-end-milling Tools with Different Coating
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2008 |
Tool Wear Monitoring: an Automated System Based on Multiple Cutting Force Parameters and Machine Vision Technique
|
邱奕契; Chiou, Yih-Chih |
中華大學 |
2008 |
Tool Wear Automatic Monitoring System Based on The Multiple Parameters of The Cutting Force And Machine Vision Technique
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2007 |
Hybrid Registration of Corresponding Mammogram Images for Automatic Detection of Breast Cancer
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2007 |
軟板線路瑕疵檢測與分類演算法之研究
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2007 |
應用不同表面鍍膜處理延長刀具壽命之研究
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2007 |
以線掃瞄為基之光碟片表面瑕疵檢測系統
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2007 |
The Study of Effects of Cutting Parameters and PVD-Coatings on Tool Life of Micro End Drill by Using Taguchi Method
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2007 |
Apply Machine Vision to Inspect Cylindrical Surfaces of PU-Packings
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2007 |
Selecting an Appropriate Segmentation Method Automatically Using ANN Classifier
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2006 |
Apply Machine Vision to the Inspection of PU-Packing
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2006 |
Vision-Based Automatic Tilapia Weighing System
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2006 |
Automatic Selection of a Segmentation Method for the Detection of Flaws
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2006 |
機器視覺自動計重之生魚處理研究
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2006 |
應用機器視覺於PU 迫緊之自動化檢測
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2006 |
An Effective Drilling Wear Measurement based on Visual Inspection Technique
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2006 |
An Edge-based Registration Method for Locating Defects on PCB Films
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2006 |
A New Method for the Registration of Mammograms
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2006 |
線掃瞄影像瑕疵偵測法之比較
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2006 |
運用機器視覺於彩色標籤之缺陷檢測
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2005 |
The High-Speed Measurement of a Partial Area Imaging System Applied to Photoresist Development Processing
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2005 |
積層陶瓷電容表面瑕疵之檢測與分類
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2005 |
AOI瑕疵檢測應用
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2005 |
應用機器視覺於LCD擴散片之檢測
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邱奕契; Chiou, Yih-Chih |
中華大學 |
2005 |
隨線套標品質檢測系統之開發
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邱奕契; Chiou, Yih-Chih |
顯示項目 36-60 / 74 (共3頁) << < 1 2 3 > >> 每頁顯示[10|25|50]項目
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