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Institution Date Title Author
國立交通大學 2014-12-08T15:10:12Z ESD protection design for giga-Hz high-speed I/O interfaces in a 130-nm CMOS process Hsiao, Yuan-Wen; Ker, Ming-Dou; Chiu, Po-Yen; Huang, Chun; Tseng, Yuh-Kuang
義守大學 2009 Ultra-low-leakage power-rail ESD clamp circuit in nanoscale low-voltage CMOS process Chiu, Po-Yen ; Ker, Ming-Dou ; Tsai, Fu-Yi ; Chang, Yeong-Jar
義守大學 2009 On the design of power-rail ESD clamp circuit with consideration of gate leakage current in 65-nm low-voltage CMOS process Ker, Ming-Dou ; Chiu, Po-Yen ; Tsai, Fu-Yi ; Chang, Yeong-Jar

Showing items 11-13 of 13  (1 Page(s) Totally)
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