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Showing items 1-11 of 11  (1 Page(s) Totally)
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Institution Date Title Author
國立成功大學 2014-11 Investigation of electromigration reliability of redistribution lines in wafer-level chip-scale packages Kao, Chin-Li; Chen, Tei-Chen; Lai, Yi-Shao; Chiu, Ying-Ta
國立成功大學 2013-09 The influence of Pd on the interfacial reactions between the Pd-plated Cu ball bond and Al pad Lin, Yu-Wei; Ke, Wun-Bin; Wang, Ren-You; Wang, I-Sheng; Chiu, Ying-Ta; Lu, Kuo-Chang; Lin, Kwang-Lung; Lai, Yi-Shao
國立成功大學 2013-02-05 Electrorecrystallization of Metal Alloy Chiu, Ying-Ta; Lin, Kwang-Lung; Wu, Albert T.; Jang, Wei-Luen; Dong, Chung-Li; Lai, Yi-Shao
國立成功大學 2012-05-01 The Pd distribution and Cu flow pattern of the Pd-plated Cu wire bond and their effect on the nanoindentation Lin, Yu-Wei; Wang, Ren-You; Ke, Wun-Bin; Wang, I-Sheng; Chiu, Ying-Ta; Lu, Kuo-Chang; Lin, Kwang-Lung; Lai, Yi-Shao
國立成功大學 2012-02-15 Dissolution of Sn in a SnPb solder bump under current stressing Chiu, Ying-Ta; Lin, Kwang-Lung; Lai, Yi-Shao
國立成功大學 2012-01-31 高鉛銲錫與其覆晶接點之電遷移行為研究 邱盈達; Chiu, Ying-Ta
國立成功大學 2012-01-12 高鉛銲錫與其覆晶接點之電遷移行為研究 邱盈達; Chiu, Ying-Ta
國立成功大學 2011-10 Supersaturation induced by current stressing Chiu, Ying-Ta; Liu, Chia-Hao; Lin, Kwang-Lung; Lai, Yi-Shao
國立成功大學 2008-07 Orientation transformation of Pb grains in 5Sn-95Pb/63Sn-37Pb composite flip-chip solder joints during electromigration test Chiu, Ying-Ta; Lin, Kwang-Lung; Lai, Yi-Shao
國立成功大學 2005-07-04 錫鋅系無鉛銲錫與基材接合反應行為研究 邱盈達; Chiu, Ying-Ta
國立成功大學 2005-07-04 錫鋅系無鉛銲錫與基材接合反應行為研究 邱盈達; Chiu, Ying-Ta

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