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| 臺大學術典藏 |
2018-09-10T08:42:51Z |
Nearly defect-free Ge gate-all-around FETs on Si substrates
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Chu, C.-L.; Tu, W.-H.; Fu, Y.-C.; Sung, P.-J.; Chang, H.-C.; Chen, Y.-T.; Cho, L.-Y.; Hsu, W.; Luo, G.-L.; Liu, C.W.; Hu, C.; Yang, F.-L.; Hsu, S.-H.; CHEE-WEE LIU et al. |
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