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Institution Date Title Author
國立成功大學 2009-02 Mura Defect Detection using Discrete Wavelet transform Chen, Shang-Liang; Chou, Shang-Ta
國立成功大學 2008 TFT-LCD Mura Defect Detection Using Wavelet and Cosine Transforms Chen, Shang-Liang; Chou, Shang-Ta
國立成功大學 2007-07-11 應用小波轉換於 TFT-LCD 之 Mura 瑕疵檢測 周尚達; Chou, Shang-Ta
國立成功大學 2007-07-11 應用小波轉換於 TFT-LCD 之 Mura 瑕疵檢測 周尚達; Chou, Shang-Ta

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