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| 國立成功大學 |
2023 |
First Demonstration of Defect Elimination for Cryogenic Ge FinFET CMOS Inverter Showing Steep Subthreshold Slope by Using Ge-on-Insulator Structure
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Yu, X.-R.;Hsieh, C.-C.;Chuang, M.-H.;Chiu, M.-Y.;Sun, T.-C.;Geng, W.-Z.;Chang, W.-H.;Shih, Y.-J.;Lu, W.-H.;Chang, W.-C.;Lin, Y.-C.;Pai, Y.-C.;Lai, C.-Y.;Chuang, M.-H.;Dei, Y.;Yang, C.-Y.;Lu, H.-Y.;Lin, N.-C.;Wu, C.-T.;Kao, Kao K.-H.;Ma, W.C.-Y.;Lu, D.D.;Lee, Y.-J.;Luo, G.-L.;Chiang, M.-H.;Maeda, T.;Wu, Wu W.-F.;Li, Y.-M.;Hou, T.-H. |
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