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Institution	Date	Title	Author
國立交通大學	2017-04-21T06:48:54Z	Failure Analysis of Gate-all-around Nanowire Field Effect Transistor Under TLP Test	Zhang, Guoyan; Dong, Aihua; Liu, Nie; Tian, Rui; Yang, Xuejiao; Liu, Zhiwei; Lee, Kohui; Lin, Horng-Chih; Liou, Juin J.; Wang Yuxin

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	English \| 正體中文 \| 简体中文 \| 总笔数 :2853327
	造访人次 : 44999004 在线人数 : 1927 教育部委托研究计画计画执行:国立台湾大学图书馆