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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
中山醫學大學 2021 Favorable Lip and Oral Cancer Mortality-to-Incidence Ratios in Countries with High Human Development Index and Expenditures on Health Sung, WW; Hsu, YC; Dong, C; Chen, YC; Chao, YC; Chen, CJ
中山醫學大學 2021 Correspondence to proton pump inhibitors and risk of colorectal cancer Dong, C; Lee, YH; Tan, TY; Yao, CC; Wei, JCC
中山醫學大學 2021 Mycophenolate Mofetil for Immune Thrombocytopenia Chen, S; Dong, C; Wei, JCC
國立交通大學 2019-04-03T06:45:04Z Electron-phonon dephasing time due to the quasistatic scattering potential in metallic glass CuZrAl Li, L.; Lin, S. T.; Dong, C.; Lin, J. J.
國立臺灣科技大學 2014 Application of cluster-plus-glue-atom model to barrierless Cu-Ni-Ti and Cu-Ni-Ta films Li, X.;Ding, J.;Wang, M.;Chu, J.P.;Dong, C.
國立臺灣科技大學 2014 Carbon-doped Cu films with self-forming passivation layer Li, X.N.;Ding, J.X.;Xu, L.Y.;Bao, C.M.;Chu, J.P.;Dong, C.
國立臺灣科技大學 2014 Thermal stability of barrierless Cu-Ni-Sn films Li, X.N.;Wang, M.;Zhao, L.R.;Bao, C.M.;Chu, J.P.;Dong, C.
國立臺灣科技大學 2013 Barrierless Cu-Ni-Nb thin films on silicon with high thermal stability and low electrical resistivity Li, X.N.;Zhao, L.R.;Li, Z.;Liu, L.J.;Bao, C.M.;Chu, J.P.;Dong, C.
國立臺灣科技大學 2012 Barrierless Cu-Ni-Mo interconnect films with high thermal stability against silicide formation Li, X.N.;Liu, L.J.;Zhang, X.Y.;Chu, J.P.;Wang, Q.;Dong, C.
國立臺灣科技大學 2011 Highly stable carbon-doped Cu films on barrierless Si Zhang, X.Y.;Li, X.N.;Nie, L.F.;Chu, J.P.;Wang, Q.;Lin, C.H.;Dong, C.
國立臺灣科技大學 2010 The preparation for Cu(Sn) films of barrierless interconnection Xu L.; Li X.; Chu J.P.; Dong C.
國立臺灣科技大學 2010 High thermal stability and low electrical resistivity carbon-containing Cu film on barrierless Si Nie L.F.; Li X.N.; Chu J.P.; Wang Q.; Lin C.H.; Dong C.
國立成功大學 2008-09-15 Transport properties of Ti-Zr-Ni quasicrystalline and glassy alloys Kuo, Y. K.; Kaurav, N.; Syu, W. K.; Sivakumar, K. M.; Shan, U. T.; Lin, S. T.; Wang, Q.; Dong, C.
國立成功大學 2006-11-20 Electron-phonon dephasing time due to the quasistatic scattering potential in metallic glass CuZrAl Li, L.; Lin, Shui-Tien; Dong, C.; Lin, Juhn-Jong
國立成功大學 2006-07 Measurement of low-temperature transport properties of Cu-based Cu-Zr-Ti bulk metallic glass Kuo, Y. K.; Sivakumar, K. M.; Su, C. A.; Ku, C. N.; Lin, Shui-Tien; Kaiser, A. B.; Qiang, J. B.; Wang, Q.; Dong, C.

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