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Institution	Date	Title	Author
元智大學	2014-7-1	3-D vision-assist guidance for robots or the visually impaired	Du-Ming Tsai; Hao Hsu; Wei-Yao Chiu
元智大學	2014-7-1	3-D vision-assist guidance for robots or the visually impaired	Du-Ming Tsai; Hao Hsu; Wei-Yao Chiu
元智大學	2014-10-12	Automatic defect inspection of TFT-LCD panels using Fourier image reconstruction	Du-Ming Tsai; Yan-Hsin Tseng; Wei-Yao Chiu
元智大學	2014-03-28	Automatic visual inspection of solar wafers using mean-shift techniques	Du-Ming Tsai; Wei-Yao Chiu; Jie-Yu Luo
元智大學	2013-12-03	Automatic visual inspection of solar modules using Independent component analysis	Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu
元智大學	2013-10-1	Machine-vision-based identification for wafer tracking in solar cell manufacturing	Du-Ming Tsai; Ming-Chin Lin
元智大學	2013-05-20	A real-time ICA-based activity recognition in video sequences	Du-Ming Tsai; Wei-Yao Chiu
元智大學	2013-02-21	Dual-mode detection for foreground segmentation in low-contrast video images	Du-Ming Tsai; Wei-Yao Chiu
元智大學	2013-02	Defect Detection in Solar Modules Using ICA Basis Images	Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu
元智大學	2013-02	Moving/motionless foreground object detection using fast statistical background updating	邱威堯; Du-Ming Tsai
元智大學	2013	A template reconstruction scheme for moving object detection from a mobile robot	Du-Ming Tsai; Tzu-Hsun Tseng
元智大學	2013	Defect Detection in Solar Modules Using ICA Basis Images	Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu
元智大學	2013	Moving/motionless foreground object detection using fast statistical background updating	Du-Ming Tsai; Wei-Yao
元智大學	2012-12-02	A Shift-tolerant Dissimilarity Measure for Surface Defect Detection	Du-Ming Tsai; I-Yung Chiang; Hao Hsu; Wei-Yao Chiu
元智大學	2012-12-02	A Shift-tolerant Dissimilarity Measure for Surface Defect Detection	Du-Ming Tsai; I-Yung Chiang; Hao Hsu; Wei-Yao Chiu
元智大學	2012-09	A fast regularity measure for surface defect detection	Du-Ming Tsai; Ming-Chun Chen; Wei-Chen Li; Wei-Yao Chiu
元智大學	2012-08	Defect detection of solar cells in electroluminescence images using Fourier image reconstruction	Du-Ming Tsai; Shih-Chieh Wu; Wei-Chen Li
元智大學	2012-06-28	A PCA-based regularity measure for surface defect inspection	Du-Ming Tsai; Wei-Yao Chiu; Ming-Chun Chen
元智大學	2012-04	Defect detection of solar cells in electroluminescence images using Fourier image reconstruction	Du-Ming Tsai; Shih-Chieh Wu; Wei-Chen Li
元智大學	2012-04	Defectdetection of solarcells in electroluminescenceimages using Fourierimagereconstruction	Du-Ming Tsai; Shih-Chieh Wu; Wei-Chen Li
元智大學	2012-02-24	ICA-based Action Recognition for Human-computer Interaction in Disturbed Backgrounds	Wei-Yao Chiu; Du-Ming Tsai
元智大學	2012-02	A shift-tolerant dissimilarity measure for surface defect detection	Du-Ming Tsai; I-Yung Chiang; Ya-Hui Tsai
元智大學	2012-02	Wavelet-based defect detection in solar wafer images with inhomogeneous texture	Wei-Chen Li; Du-Ming Tsai
元智大學	2012-02	Wavelet-based defect detection in solar wafer images with inhomogeneous texture	Du-Ming Tsai; Wei-Chen Li
元智大學	2011-10-14	Automatic Saw-Mark Detection in Multicrystalline Solar Wafer Images	Wei-Chen Li; Du-Ming Tsai

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