臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Showing items 36-45 of 89 (9 Page(s) Totally)
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Institution	Date	Title	Author
國立交通大學	2019-08-20T06:33:52Z	「工業工程與系統管理之回顧與展望」特刊：序言	簡禎富; 王國明; 陳茂生; 廖慶榮; 江行全; 張瑞芬; 蔡篤銘; 王茂駿; 吳建瑋; Chen-Fu Chien; Kuo-Ming Wang; Mao-Sheng Chen; Ching-Jong Liao; Bernard C Jiang; Amy J. C. Trappey; Du-Ming Tsai; Mao-Jiun Wang; Chien-Wei Wu
元智大學	2019-02-25	Saw-mark Defect Detection in Heterogeneous Solar Wafer Images using GAN-based Training Samples Generation and CNN Classification	Du-Ming Tsai; Shu-Kai Fan; Yi-Quan Huang; Wei-Yao Chiu
元智大學	2018-12-05	Segmentation of coffee plantation area in satellite images using Fourier features	Du-Ming Tsai; Du-Ming Tsai; Wei-Yao Chiu
元智大學	2018-12	Segmentation of coffee plantation area in satellite images using Fourier features	Du-Ming Tsai; Wan-Ling Chen; Wei-Yao Chiu
元智大學	2018-05-20	Defect inspection of liquid-crystal-display (LCD) panels in repetitive pattern images using 2D Fourier image reconstruction	Du-Ming Tsai; Morris Fan; Yan Hsin Tseng
元智大學	2018-05-20	Key Parameter Identification for Faulty Wafer Detection Using Image Processing	Shu-Kai S. Fan; Du-Ming Tsai; Chih-Hung Jen; Rui-Yu Huang; Kuan-Lung Chen
元智大學	2018-05-20	Defect Inspection of Liquid-Crystal-Display (LCD) Panels in Repetitive Pattern Images Using 2D Fourier Image Reconstruction	Du-Ming Tsai; Yan-Hsin Tseng; S. K. Morris Fan
元智大學	2017-12-03	Automated Visual Inspection Of Multicrystalline Solar Wafers Using Wavelet Discrimination Measure	Du-Ming Tsai; Ching-Hau Peng
元智大學	2017-07-22	Object detection and positioning using fast spiral search	Wei-Yao Chiu; Du-Ming Tsai; Morris Fan; Ching-Hau Peng
元智大學	2016-05-10	Optical-flow-based template matching for surface defect detection	Du-Ming Tsai; I-Yung Chiang; Wei-Yao Chiu

Showing items 36-45 of 89 (9 Page(s) Totally)
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