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"dumcenco d"
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| 國立臺灣科技大學 |
2014 |
Electrical transport properties of single-layer WS2
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Ovchinnikov, D.;Allain, A.;Huang, Y.-S.;Dumcenco, D.;Kis, A. |
| 國立臺灣科技大學 |
2013 |
Energy spectrum of near-edge holes and conduction mechanisms in Cu 2ZnSiSe4 single crystals
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Lisunov, K.G.;Guc, M.;Levcenko, S.;Dumcenco, D.;Huang, Y.S.;Gurieva, G.;Schorr, S.;Arushanov, E. |
| 國立臺灣科技大學 |
2013 |
The vibrational properties study of kesterite Cu2ZnSnS 4 single crystals by using polarization dependent Raman spectroscopy
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Dumcenco, D.;Huang, Y.-S. |
| 國立臺灣科技大學 |
2012 |
Optical characterization of Zn 0.35Cd 0.44Mg 0.21Se crystalline alloy by polarization-dependent contactless electroreflectance measurements
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Dumcenco, D.;Levcenco, S.;Huang, Y.-S.;Hsu, H.-P.;Firszt, F.;Tiong, K.-K. |
| 國立臺灣科技大學 |
2012 |
Raman scattering characterization of Zn 1-x-yMg yBe xSe mixed crystals
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Dumcenco, D.;Wu, J.-D.;Huang, Y.-S.;Hsu, H.-P.;Firszt, F.;Tiong, K.-K. |
| 國立臺灣科技大學 |
2012 |
Influence of anionic substitution on the electrolyte electroreflectance study of band edge transitions in single crystal Cu 2ZnSn(S xSe 1-x) 4 solid solutions
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Levcenco, S.;Dumcenco, D.;Wang, Y.P.;Huang, Y.S.;Ho, C.H.;Arushanov, E.;Tezlevan, V.;Tiong, K.K. |
| 國立臺灣科技大學 |
2012 |
Above-room-temperature photoluminescence from a strain-compensated Ge/Si 0.15Ge 0.85 multiple-quantum-well structure
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Wu, P.H.;Dumcenco, D.;Huang, Y.S.;Hsu, H.P.;Lai, C.H.;Lin, T.Y.;Chrastina, D.;Isella, G.;Gatti, E.;Tiong, K.K. |
| 淡江大學 |
2011-06 |
Polarization-dependent electrolyte electroreflectance study of Cu2ZnSiS4 and Cu2ZnSiSe4 single crystals
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Levcenco, S.; Dumcenco, D.; Huang, Y. S.; Arushanov, E.; Tezlevan, V.; Tiong, K. K.; Du, C. H. |
| 國立臺灣科技大學 |
2011 |
Polarization-dependent electrolyte electroreflectance study of Cu2ZnSiS4 and Cu2ZnSiSe4 single crystals
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Levcenco, S.;Dumcenco, D.;Huang, Y.S.;Arushanov, E.;Tezlevan, V.;Tiong, K.K.;Du, C.H. |
| 國立臺灣科技大學 |
2011 |
Absorption-edge anisotropy of Cu(2)ZnSiQ(4) (Q = S, Se) quaternary compound semiconductors
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Levcenco, S.;Dumcenco, D.;Huang, Y.S.;Arushanov, E.;Tezlevan, V.;Tiong, K.K.;Du, C.H. |
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