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Showing items 1-4 of 4 (1 Page(s) Totally)
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| 臺大學術典藏 |
2020-01-13T08:21:31Z |
3-D surface profilometry for objects having extremely different reflectivity regions
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Chen, L.-C.; Duong, D.-H.; Chen, C.-S.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2021-08-05T02:37:31Z |
A Novel Feature Detection Method Using Multi-Dimensional Image Fusion for Automated Optical Inspection on Critical Dimension [適用於關鍵尺寸自動光學檢測的創新多維融合圖像特徵偵測方法]
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Chen L.-C;Liang C.-W;Hoang D.-C;Duong D.-H;Chen C.-S;Lin S.-T.; Chen L.-C; Liang C.-W; Hoang D.-C; Duong D.-H; Chen C.-S; Lin S.-T.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2021-02-04T02:48:56Z |
Absolute depth measurement using multiphase normalized cross-correlation for precise optical profilometry
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Duong, D.-H.; Chen, C.-S.; Chen, L.-C.; Duong, D.-H.; Chen, C.-S.; Chen, L.-C.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2020-01-13T08:21:28Z |
Optical 3-D profilometry for measuring semiconductor wafer surfaces with extremely variant reflectivities
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Chen, L.-C.; Duong, D.-H.; Chen, C.-S.; LIANG-CHIA CHEN |
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