|
|
???tair.name??? >
???browser.page.title.author???
|
"dutton r w"???jsp.browse.items-by-author.description???
Showing items 1-6 of 6 (1 Page(s) Totally)
1
View [10|25|50] records per page
| 國立臺灣大學 |
2007 |
A built-in technique for measuring substrate and power supply digital switching noise using PMOS-based differential sensors and a waveform sampler in system-on-chip applications
|
Iorga, C.; Lu, Yi-Chang; Dutton, R.W. |
| 臺大學術典藏 |
2007 |
A built-in technique for measuring substrate and power supply digital switching noise using PMOS-based differential sensors and a waveform sampler in system-on-chip applications
|
Iorga, C.; Lu, Yi-Chang; Dutton, R.W.; Iorga, C.; Lu, Yi-Chang; Dutton, R.W. |
| 國立臺灣大學 |
1989-09 |
Performance analysis of a BiNMOS device
|
Kuo, J.B.; Rosseel, G.P.; Dutton, R.W. |
| 國立臺灣大學 |
2009 |
Thermal Modeling and Device Noise Properties of Three-Dimensional–SOI Technology
|
Chen, Tze Wee; Chun, Jung Hoon; Lu, Yi-chang; Navid, R.; Wang, Wei; Chen, Chang-Lee; Dutton, R.W. |
| 臺大學術典藏 |
2009 |
Thermal Modeling and Device Noise Properties of Three-Dimensional–SOI Technology
|
Chen, Tze Wee; Chun, Jung Hoon; Lu, Yi-Chang; Navid, R.; Wang, Wei; Chen, Chang-Lee; Dutton, R.W.; Chen, Tze Wee; Chun, Jung Hoon; Lu, Yi-chang; Navid, R.; Wang, Wei; Chen, Chang-Lee; Dutton, R.W. |
| 臺大學術典藏 |
2020-06-16T06:36:20Z |
Thermal modeling and device oise properties of three-dimensional-SOI technology
|
Chen, T.W.;Chun, J.-H.;Lu, Y.-C.;Navid, R.;Wang, W.;Chen, C.-L.;Dutton, R.W.; Chen, T.W.; Chun, J.-H.; Lu, Y.-C.; Navid, R.; Wang, W.; Chen, C.-L.; Dutton, R.W.; YI-CHANG LU |
Showing items 1-6 of 6 (1 Page(s) Totally)
1
View [10|25|50] records per page
|
