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| 國立臺灣大學 |
1998-01 |
Photoluminescence and Raman Scattering characterization of GaN, InGaN and AlGaN films using a UV Excitation Raman-Photoluminescence microscope
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Feng, Z.C.; Schurman, M.; Tran, C.; Salagaj, T.; Karlicek, B.; Ferguson, I.; Stall, R.A.; Dyer, C.D.; Williams, K.P.J.; Pitt, G.D. |
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