臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T05:29:21Z	Diagnosis of Resistive and Stuck-open Defects in Digital CMOS IC	Li, J. C.-M.; E. J. McCluskey; CHIEN-MO LI
臺大學術典藏	2018-09-10T04:59:51Z	ELF-Murphy Data on Defects and Test Sets	E. J. McCluskey; A. Alyamani; J. C. M. Li; C. W. Tseng; E. Volkerink; F. F. Feriani; E. Li; S. Mitra; CHIEN-MO LI
臺大學術典藏	2018-09-10T04:15:41Z	Diagnosis for Sequence Dependent Chips	Li, J. C.M.; E. J. McCluskey; CHIEN-MO LI
臺大學術典藏	2018-09-10T03:50:57Z	Testing for Resistive and Stuck Opens	Li, J. C.M.; Tseng, C.W.; E.J. McCluskey; CHIEN-MO LI
臺大學術典藏	2018-09-10T03:50:57Z	Diagnosis of Tunneling Opens	Li, J. C.M.; E.J. McCluskey; CHIEN-MO LI

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