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Taiwan Academic Institutional Repository >
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"ejeckam fe"
Showing items 1-4 of 4 (1 Page(s) Totally) 1 View [10|25|50] records per page
| 臺大學術典藏 |
2018-09-10T05:56:14Z |
Reliability studies of wafer-bonded InGaAs PIN photodetectors on GaAs substrates
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Ejeckam, FE;Chua, CL;Zhu, Z-H;Lo, YH;Hong, Mingyi;Mannaerts, JP;Bhat, Ritesh; Ejeckam, FE; Chua, CL; Zhu, Z-H; Lo, YH; Hong, Mingyi; Mannaerts, JP; Bhat, Ritesh; MINGHWEI HONG |
| 臺大學術典藏 |
2018-09-10T05:56:14Z |
Reliability studies of wafer-bonded InGaAs PIN photodetectors on GaAs substrates
|
Ejeckam, FE;Chua, CL;Zhu, Z-H;Lo, YH;Hong, Mingyi;Mannaerts, JP;Bhat, Ritesh; Ejeckam, FE; Chua, CL; Zhu, Z-H; Lo, YH; Hong, Mingyi; Mannaerts, JP; Bhat, Ritesh; MINGHWEI HONG |
| 臺大學術典藏 |
2018-09-10T05:21:15Z |
High-performance InGaAs photodetectors on Si and GaAs substrates
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Ejeckam, FE;Chua, CL;Zhu, ZH;Lo, YH;Hong, M;Bhat, R; Ejeckam, FE; Chua, CL; Zhu, ZH; Lo, YH; Hong, M; Bhat, R; MINGHWEI HONG |
| 臺大學術典藏 |
2018-09-10T05:21:15Z |
High-performance InGaAs photodetectors on Si and GaAs substrates
|
Ejeckam, FE;Chua, CL;Zhu, ZH;Lo, YH;Hong, M;Bhat, R; Ejeckam, FE; Chua, CL; Zhu, ZH; Lo, YH; Hong, M; Bhat, R; MINGHWEI HONG |
Showing items 1-4 of 4 (1 Page(s) Totally) 1 View [10|25|50] records per page
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