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"fan chih min"
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| 臺大學術典藏 |
2018-09-10T07:37:15Z |
SHEWMAC: An end-of-line SPC scheme for joint monitoring of process mean and variance
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Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John; SHI-CHUNG CHANG |
| 國立臺灣大學 |
2005-09 |
Design of Collaborative Engineering Data System (CEDS): an application case of process integration
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Fan, Chih-Min; Chang, Shi-Chung; Chang, Henry |
| 國立臺灣大學 |
2003-10 |
Integrated yield-mining solution with enhanced electrical test data correlation
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Fan, Chih-Min; Guo, Ruey-Shan; Chen, Argon; Hon, Amos; Wei, John; King, Mingchu |
| 臺大學術典藏 |
2003-10 |
Integrated yield-mining solution with enhanced electrical test data correlation
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King, Mingchu; Hon, Amos; Wei, John; Chen, Argon; Guo, Ruey-Shan; Fan, Chih-Min; Fan, Chih-Min; Guo, Ruey-Shan; Chen, Argon; Hon, Amos; Wei, John; King, Mingchu |
| 國立臺灣大學 |
2000-08 |
SHEWMA: an End-of-line SPC Scheme Using Wafer Acceptance Test Data
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Fan, Chih-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Wei, Chih-Shih |
| 臺大學術典藏 |
2000-08 |
SHEWMA: an End-of-line SPC Scheme Using Wafer Acceptance Test Data
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Wei, Chih-Shih; Chang, Shi-Chung; Guo, Ruey-Shan; Fan, Chih-Min; Fan, Chih-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Wei, Chih-Shih |
| 國立臺灣大學 |
2000-06 |
SHEWMAC: an end-of-line SPC scheme via exponentially weighted moving statistics
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Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, Chih-Shih |
| 國立臺灣大學 |
1999-10 |
SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance
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Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John |
| 臺大學術典藏 |
1999-10 |
SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance
|
Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John; Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John |
| 國立臺灣大學 |
1997-06 |
EWMA/SD: an end-of-line SPC scheme to monitor sequence-disordered data [semiconductor manufacturing]
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Fan, Chih-Min; Guo, Ruey-Shan; Chang, Shi-Chung |
Showing items 1-10 of 10 (1 Page(s) Totally)
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