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机构 日期 题名 作者
國立交通大學 2014-12-08T15:28:05Z Impacts of Random Telegraph Noise on FinFET Devices, 6T SRAM cell, and Logic Circuits Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:25:21Z Investigation of Static Noise Margin of FinFET SRAM Cells in Sub-threshold Region Fan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:24:25Z Investigation of Static Noise Margin of Ultra-Thin-Body SOI SRAM Cells in Subthreshold Region using Analytical Solution of Poisson's Equation Hu, Vita Pi-Ho; Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:23:48Z "Analysis of Single-Trap-Induced Random Telegraph Noise on FinFET Devices, 6T SRAM Cell, and Logic Circuits" Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:23:33Z Independently-Controlled-Gate FinFET Schmitt Trigger Sub-Threshold SRAMs Hsieh, Chien-Yu; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:21:25Z Band-to-Band-Tunneling Leakage Suppression for Ultra-Thin-Body GeOI MOSFETs Using Transistor Stacking Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:21:20Z Impacts of Single Trap Induced Random Telegraph Noise on FinFET Devices and SRAM Cell Stability Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:21:19Z Comprehensive Analysis of UTB GeOI Logic Circuits and 6T SRAM Cells considering Variability and Temperature Sensitivity Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:19:54Z Design and Analysis of Ultra-Thin-Body SOI Based Subthreshold SRAM Hu, Vita Pi-Ho; Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:12:04Z FinFET SRAM Cell Optimization Considering Temporal Variability Due to NBTI/PBTI, Surface Orientation and Various Gate Dielectrics Hu, Vita Pi-Ho; Fan, Ming-Long; Hsieh, Chien-Yu; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:12:03Z Comparison of 4T and 6T FinFET SRAM Cells for Subthreshold Operation Considering Variability-A Model-Based Approach Fan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Hsieh, Chien-Yu; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:08:46Z Static Noise Margin of Ultrathin-Body SOI Subthreshold SRAM Cells-An Assessment Based on Analytical Solutions of Poisson's Equation Hu, Vita Pi-Ho; Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:07:33Z Investigation of Switching-Time Variations for Nanoscale MOSFETs Using the Effective-Drive-Current Approach Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin
國立交通大學 2014-12-08T15:06:44Z Investigation of Cell Stability and Write Ability of FinFET Subthreshold SRAM Using Analytical SNM Model Fan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te

显示项目 46-59 / 59 (共3页)
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