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Showing items 21-45 of 59  (3 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-16T06:15:00Z INDEPENDENTY-CONTROLLED-GATE SRAM CHUANG Ching-Te; Chen Yin-Nien; Hsieh Chien-Yu; Fan Ming-Long; Hu Pi-Ho; Su Pin
國立交通大學 2014-12-16T06:14:14Z Schmitt trigger-based finFET SRAM cell Chuang Ching-Te; Hsieh Chien-Yu; Fan Ming-Long; Hu Pi-Ho; Su Pin
國立交通大學 2014-12-16T06:13:52Z Independently-controlled-gate SRAM Chuang Ching-Te; Chen Yin-Nien; Hsieh Chien-Yu; Fan Ming-Long; Hu Pi-Ho; Su Pin
國立交通大學 2014-12-12T02:45:23Z 鰭狀、穿隧場效電晶體和異質通道三維積體超薄層元件於超低功耗靜態隨機存取記憶體和邏輯電路之設計與分析 范銘隆; Fan, Ming-Long; 蘇彬; Su, Pin
國立交通大學 2014-12-08T15:38:27Z Evaluation of Static Noise Margin and Performance of 6T FinFET SRAM Cells with Asymmetric Gate to Source/Drain Underlap Devices Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:38:26Z Independently-Controlled-Gate FinFET Schmitt Trigger Sub-threshold SRAMs Hsieh, Chien-Yu; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:36:58Z Stability and Performance Optimization of Heterochannel Monolithic 3-D SRAM Cells Considering Interlayer Coupling Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:36:16Z Analysis of Ultra-Thin-Body SOI Subthreshold SRAM Considering Line-Edge Roughness, Work Function Variation, and Temperature Sensitivity Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:36:11Z FinFET SRAM Cell Optimization Considering Temporal Variability due to NBTI/PBTI and Surface Orientation Hu, Vita Pi-Ho; Fan, Ming-Long; Hsieh, Chien-Yu; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:35:52Z Single-trap-induced random telegraph noise for FinFET, Si/Ge Nanowire FET, Tunnel FET, SRAM and logic circuits Fan, Ming-Long; Yang, Shao-Yu; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:35:18Z Impacts of Single Trap Induced Random Telegraph Noise on Si and Ge Nanowire FETs, 6T SRAM Cells and Logic Circuits Yang, Shao-Yu; Chen, Yin-Nien; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:32:43Z Analysis of Germanium FinFET Logic Circuits and SRAMs with Asymmetric Gate to Source/Drain Underlap Devices Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:32:43Z Source/Drain Series Resistance Induced Feedback Effect on Drain Current Mismatch and Its Implication Kuo, Jack J. -Y.; Fan, Ming-Long; Lee, Wei; Su, Pin
國立交通大學 2014-12-08T15:32:43Z Design and Optimization of 6T SRAM using Vertically Stacked Nanowire MOSFETs Tsai, Ming-Fu; Fan, Ming-Long; Pao, Chia-Hao; Chen, Yin-Nien; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:32:20Z Comparative Leakage Analysis of GeOI FinFET and Ge Bulk FinFET Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:32:12Z Investigation of Single-Trap-Induced Random Telegraph Noise for Tunnel FET Based Devices, 8T SRAM Cell, and Sense Amplifiers Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:32:12Z Device Design and Analysis of Logic Circuits and SRAMs for Germanium FinFETs on SOI and Bulk Substrates Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:31:13Z Threshold Voltage Design of UTB SOI SRAM With Improved Stability/Variability for Ultralow Voltage Near Subthreshold Operation Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:30:35Z Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FET Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nein; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:30:30Z Threshold Voltage Design and Performance Assessment of Hetero-Channel SRAM Cells Hu, Vita Pi-Ho; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:30:25Z Design and Analysis of Robust Tunneling FET SRAM Chen, Yin-Nien; Fan, Ming-Long; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:30:22Z Investigation and Comparison of Work Function Variation for FinFET and UTB SOI Devices Using a Voronoi Approach Chou, Shao-Heng; Fan, Ming-Long; Su, Pin
國立交通大學 2014-12-08T15:30:04Z Variation Tolerant CLSAs for Nanoscale Bulk-CMOS and FinFET SRAM Tsai, Ming-Fu; Tsai, Jen-Huan; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:30:03Z A Comprehensive Comparative Analysis of FinFET and Trigate Device, SRAM and Logic Circuits Pao, Chia-Hao; Fan, Ming-Long; Tsai, Ming-Fu; Chen, Yin-Nien; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te
國立交通大學 2014-12-08T15:29:40Z Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications Fan, Ming-Long; Hu, Vita Pi-Ho; Chen, Yin-Nien; Su, Pin; Chuang, Ching-Te

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