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Taiwan Academic Institutional Repository >
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"fang yean kuen"
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| 國立成功大學 |
2016-01 |
Investigation of low-frequency noise of 28-nm technology process of high-k/metal gate p-MOSFETs with fluorine incorporation
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Kao, Tsung-Hsien; Chang, Shoou-Jinn; Fang, Yean-Kuen; Huang, Po-Chin; Wang, Bo-Chin; Wu, Chung-Yi; Wu, San-Lein |
| 國立成功大學 |
2015-03 |
Impact of Uniaxial Strain on Random Telegraph Noise in High-k/Metal Gate pMOSFETs
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Huang, Po-Chin; Chen, Jone F.; Tsai, Shih Chang; Wu, San Lein; Tsai, Kai-Shiang; Kao, Tsung Hsien; Fang, Yean-Kuen; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert |
| 國立成功大學 |
2015 |
The IGZO fully transparent oxide thin film transistor on glass substrate
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Lin, Cheng-I; Fang, Yean-Kuen; Chang, Wei-Chao |
| 國立成功大學 |
2014-09-01 |
Studies of the new findings in preparing a scaled amorphous silicon thin-film transistor
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Lin, Cheng-I; Fang, Yean-Kuen; Kuo, Che-Hao |
| 國立成功大學 |
2014-09 |
Impact of Aluminum Ion Implantation on the Low Frequency Noise Characteristics of Hf-Based High-k/Metal Gate pMOSFETs
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Kao, Tsung-Hsien; Wu, San-Lein; Wu, Chung-Yi; Fang, Yean-Kuen; Wang, Bo-Chin; Huang, Po Chin; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Chang, Shoou-Jinn |
| 國立成功大學 |
2014-08-11 |
Investigation of trap properties in high-k/metal gate p-type metal-oxide-semiconductor field-effect-transistors with aluminum ion implantation using random telegraph noise analysis
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Kao, Tsung-Hsien; Chang, Shoou-Jinn; Fang, Yean-Kuen; Huang, Po-Chin; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Wu, Chung-Yi; Wu, San-Lein |
| 國立成功大學 |
2014-08 |
Investigation of trap properties of Hf0.83Zr0.17O2 high-k gate stack p-type MOSFETs by low-frequency (1/f) noise and random telegraph noise analyses
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Tsar, Shih-Chang; Wu, San-Lein; Huang, Po-Chin; Wang, Bo-Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Cheng, Osbert; Fang, Yean-Kuen; Chang, Shoou-Jinn; Chen, Jone-Fang |
| 國立成功大學 |
2014-05 |
Effect of gate barrier and channel buffer layer on electric properties and transparence of the a-IGZO thin film transistor
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Lin, Cheng-I; Fang, Yean-Kuen; Chang, Wei-Chao; Chiou, Mao-Wei; Chen, Chih-Wei |
| 國立成功大學 |
2014-04 |
Trap properties of high-k/metal gate pMOSFETs with aluminum ion implantation by random telegraph noise and 1/f noise measurements
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Kao, Tsung-Hsien; Wu, San-Lein; Tsai, Kai-Shiang; Fang, Yean-Kuen; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Chang, Shoou-Jinn |
| 國立成功大學 |
2014 |
Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain
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Tsai, Shih-Chang; Wu, San-Lein; Chen, Jone-Fang; Wang, Bo-Chin; Huang, Po Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Lo, Kun-Yuan; Cheng, Osbert; Fang, Yean-Kuen |
Showing items 1-10 of 182 (19 Page(s) Totally)
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