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Taiwan Academic Institutional Repository >
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"fang yean kuen"
Showing items 26-35 of 182 (19 Page(s) Totally)
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| 國立成功大學 |
2009-08 |
The effects of STI induced mechanical strain on GIDL current in Hf-based and SiON MOSFETs
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Cheng, C. Y.; Fang, Yean-Kuen; Liao, J. C.; Wang, T. J.; Hou, Y. T.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S. |
| 國立成功大學 |
2009-08 |
New Observations in LOD Effect of 45-nm P-MOSFETs With Strained SiGe Source/Drain and Dummy Gate
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Cheng, Chung-Yun; Fang, Yean-Kuen; Hsieh, Jang-Cheng; Yang, Sheng-Jier; Sheu, Yi-Ming; Hsia, Harry |
| 國立高雄大學 |
2009-07 |
Effect of Nitrogen Incorporation in a Gd Cap Layer on the Reliability of Deep-Submicrometer Hf-Based High-k/Metal-Gate nMOSFETs
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Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, Chun-Yu; Lin, Chien-Ting; Hsu, Che-Hua; Cheng, Li-Wei; Lai, Chien-Ming |
| 國立成功大學 |
2009-07 |
Effect of Nitrogen Incorporation in a Gd Cap Layer on the Reliability of Deep-Submicrometer Hf-Based High-k/Metal-Gate nMOSFETs
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Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, Chun-Yu; Lin, Chien-Ting; Hsu, Che-Hua; Cheng, Li-Wei; Lai, Chien-Ming |
| 國立成功大學 |
2009-07 |
N-SiCN/P-Silicon Heterojunction With Porous Silicon Buffer Layer for Low-Cost and High-Temperature Ultraviolet (UV) Detecting Applications
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Chiang, Yen-Ting; Fang, Yean-Kuen; Chou, Tse-Heng; Lin, Cheng-I; Juang, Feng-Renn; Kuo, Ta-Wei; Wu, Kuen-Hsien; Ho, Mingtsu; Shie, Jin-Shu |
| 國立成功大學 |
2009-05-07 |
Origins of flash lamp annealing induced p-n junction leakages in a 45 nm p-MOSFET with strained SiGe source/drain
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Cheng, C. Y.; Fang, Yean-Kuen; Hsieh, J. C.; Hsia, H.; Lin, S. S.; Hou, C. S.; Ku, K. C.; Sheu, Y. M. |
| 國立成功大學 |
2009-04 |
Hot-Carrier and Fowler-Nordheim (FN) Tunneling Stresses on RF Reliability of 40-nm PMOSFETs With and Without SiGe Source/Drain
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Tang, Mao-Chyuan; Fang, Yean-Kuen; Chen, David C.; Yeh, Chune-Sin |
| 國立成功大學 |
2009-04 |
Narrow Width and Length Dependence of SiGe and Sallow-Trench-Isolation Stress Induced Defects in 45 nm p-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Strained SiGe Source/Drain
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Cheng, Chung-Yun; Fang, Yean-Kuen; Hsieh, Jang-Cheng; Sheu, Yi-Ming; Hsia, Harry; Chen, Wei-Ming; Lin, Shyue-Shyh; Hou, Chin-Shan |
| 國立成功大學 |
2008-11-21 |
Effect of hot carrier stress on RF reliability of 40 nm PMOSFETs with and without SiGe source/drain
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Tang, Mao-Chyuan; Fang, Yean-Kuen; Wei, Sun-Chin; Chen, David C.; Yeh, Chune-Sin; Huang-Lu, Shiang |
| 國立成功大學 |
2008-11-10 |
The influence of nitrogen incorporation on performance and bias temperature instability of metal oxide semiconductor field effect transistors with ultrathin high-k gate stacks
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Liao, Jia-Ching; Fang, Yean-Kuen; Chen, C. H.; Hou, Y. T.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S. |
Showing items 26-35 of 182 (19 Page(s) Totally)
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