|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"fang yean kuen"
Showing items 36-60 of 182 (8 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 > >>
View [10|25|50] records per page
| 國立成功大學 |
2008-11 |
Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer
|
Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting |
| 國立成功大學 |
2008-11 |
Effect of the pre-gate oxide cleaning temperature on the reliability of GOI and devices performances in deep submicron CMOS technology
|
Chiang, Yen-Ting; Fang, Yean-Kuen; Huang, Y. J.; Chou, T. H.; Yeh, S. Y.; Lin, C. S. |
| 國立成功大學 |
2008-11 |
The Pd/TiO2/n-LTPS Thin-Film Schottky Diode on Glass Substrate for Hydrogen Sensing Applications
|
Chou, Tse-Heng; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, Kung-Cheng; Lin, Cheng-I; Kao, Chyuan-Haur; Lin, Hsiao-Yi |
| 國立成功大學 |
2008-10-07 |
Effect of STI stress on leakage and V-ccmin of a sub-65nm node low-power SRAM
|
Lee, Tung-Hsing; Fang, Yean-Kuen; Chiang, Yen-Ting; Chiu, Hua-Yueh; Chen, Ming-Shing; Cheng, Osbert |
| 國立高雄大學 |
2008-10 |
Significant improvement of 45 nm and beyond complementary metal oxide semiconductor field effect transistor performance with fully silicided and ultimate spacer process technology
|
Hsu, Chia-Wei; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan; Hsu, Che-Hua; Lai, Chieh-Ming; Cheng, Li-Wei; Ma, Mike |
| 國立成功大學 |
2008-09-25 |
Improving hydrogen detecting performance of a Pd/n-LTPS/glass thin film Schottky diode with a TiO2 interface layer
|
Chou, Tse-Heng; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, Cheng-I; Lin, Kung-Cheng |
| 國立成功大學 |
2008-09-15 |
A low cost n-SiCN/p-SiCN homojunction for high temperature and high gain ultraviolet detecting applications
|
Chou, Tse-Heng; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, Cheng-I; Yang, Che-Yun |
| 國立成功大學 |
2008-09-15 |
GaN UV MSM photodetector on porous beta-SiC/(111)Si substrates
|
Chang, Shiuan-Ho; Fang, Yean-Kuen; Hsu, Kai-Chun; Wei, Tzu-Chieh |
| 國立成功大學 |
2008-09-01 |
Significant improvement of 45 nm and beyond complementary metal oxide semiconductor field effect transistor performance with fully silicided and ultimate spacer process technology
|
Hsu, Chia-Wei; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan; Hsu, Che-Hua; Lai, Chieh-Ming; Cheng, Li-Wei; Ma, Mike |
| 國立成功大學 |
2008-09-01 |
Strain effect and channel length dependence of bias temperature instability on complementary metal-oxide-semiconductor field effect transistors with high-k/SiO2 gate stacks
|
Liao, J. C.; Fang, Yean-Kuen; Hou, Y. T.; Hung, C. L.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S. |
| 國立成功大學 |
2008-08 |
A high current gain gate-controlled lateral bipolar junction transistor with 90 nm CMOS technology for future RF SoC applications
|
Chen, Shuo-Mao; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, I. C.; Chiang, Yen-Ting |
| 國立高雄大學 |
2008-07 |
Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer
|
Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting |
| 國立成功大學 |
2008-06 |
Investigation and modeling of hot carrier effects on performance of 45-and 55-nm NMOSFETs with RF automatic measurement
|
Tang, Mao-Chyuan; Fang, Yean-Kuen; Liao, Wen-Shiang; Chen, David C.; Yeh, Chune-Sin; Chien, Shan-Chieh |
| 國立成功大學 |
2008-05 |
Dynamic negative bias temperature instability (NBTI) of low-temperature polycrystalline silicon (LTPS) thin-film transistors
|
Liao, J. C.; Fang, Yean-Kuen; Kao, C. H.; Cheng, C. Y. |
| 國立成功大學 |
2008-05 |
Investigation of bulk traps enhanced gate-induced leakage current in Hf-based MOSFETs
|
Liao, Jia-Ching; Fang, Yean-Kuen; Hou, Y. T.; Tseng, W. H.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S. |
| 國立成功大學 |
2008-04-30 |
Observations in trapping characteristics of positive bias temperature instability on high-k/metal gate n-type metal oxide semiconductor field effect transistor with the complementary multi-pulse technique
|
Liao, J. C.; Fang, Yean-Kuen; Hou, Y. T.; Wu, W. H.; Hung, C. L.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S. |
| 國立成功大學 |
2008-04 |
Observation of reliability of HfZrOX gate dielectric devices with different Zr/Hf ratios
|
Liao, Jing-Chyi; Fang, Yean-Kuen; Hou, Yong Tian; Tseng, Wei Hsiung; Yang, Chih I.; Hsu, Peng Fu; Chao, Yuen Shun; Lin, Kang Cheng; Huang, Kuo Tai; Lee, Tzu Liang; Liang, Meng Sung |
| 國立成功大學 |
2008-04 |
Effect of etch stop layer stress on negative bias temperature instability of deep submicron p-type metal-oxide-semiconductor field effect transistors with dual gate oxide
|
Chen, Ming-Shing; Fang, Yean-Kuen; Lee, Tung-Hsing; Lin, Chien-Ting; Chiang, Yen-Ting; Ko, Joe; Sheu, Yau Kae; Shen, Tsong Lin; Liao, Wen Yi |
| 國立成功大學 |
2008-03-31 |
Impact of the strained SiGe source/drain on hot carrier reliability for 45 nm p-type metal-oxide-semiconductor field-effect transistors
|
Cheng, C. Y.; Fang, Yean-Kuen; Hsieh, J. C.; Hsia, H.; Chen, W. M.; Lin, S. S.; Hou, C. S. |
| 國立成功大學 |
2008-02-21 |
Mechanism and modelling of source/drain asymmetry variation in 65nm CMOS devices for SRAM and logic applications
|
Lee, Tung-Hsing; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, C. T.; Chen, Ming-Shing; Cheng, Osbert |
| 國立成功大學 |
2008-02 |
Observation of room temperature negative differential resistance (NDR) in organic light-emitting diode with inorganic dopant
|
Fang, Yean-Kuen; Chiang, Yen-Ting; Chen, Shih-Fang; Lin, Chun-Yu; Hou, Shul-Ching; Hung, Chih-Sheng; Tsai, Tzong-Yow; Chang, Shiuan-Ho; Chou, Tse-Heng |
| 國立成功大學 |
2008-02 |
A novel electrochromic device with high optical switching speed
|
Fang, Yean-Kuen; Chou, Tse-Heng; Lin, Chun-Yu; Chiang, Yen-Ting; Chen, Shih-Fang; Yang, Che-Yun; Chang, Shiuan-Ho; Lin, Chun-Sheng |
| 國立高雄大學 |
2008 |
A high current gain gate-controlled lateral bipolar junction transistor with 90 nm CMOS technology for future RF SoC applications
|
Chen, Shuo-Mao; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, I.C.; Chiang, Yen-Ting |
| 國立成功大學 |
2007-10 |
A novel STI etching technology to mitigate an inverse narrow width effect, and improve device performances for 90 nm node and beyond CMOS technology
|
Chiu, Hua-Yueh; Fang, Yean-Kuen; Chou, T. H.; Chiang, Yen-Ting; Lin, C. I. |
| 國立成功大學 |
2007-09 |
CMOS dual-work-function engineering by using implanted Ni-FUSI
|
Lin, Chien-Ting; Ramin, Manfred; Pas, Michael; Wise, Rick; Fang, Yean-Kuen; Hsu, Che-Hua; Huang, Yao-Tsung; Cheng, Li-Wei; Ma, Mike |
Showing items 36-60 of 182 (8 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 > >>
View [10|25|50] records per page
|
