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Showing items 36-85 of 182  (4 Page(s) Totally)
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Institution Date Title Author
國立成功大學 2008-11 Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting
國立成功大學 2008-11 Effect of the pre-gate oxide cleaning temperature on the reliability of GOI and devices performances in deep submicron CMOS technology Chiang, Yen-Ting; Fang, Yean-Kuen; Huang, Y. J.; Chou, T. H.; Yeh, S. Y.; Lin, C. S.
國立成功大學 2008-11 The Pd/TiO2/n-LTPS Thin-Film Schottky Diode on Glass Substrate for Hydrogen Sensing Applications Chou, Tse-Heng; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, Kung-Cheng; Lin, Cheng-I; Kao, Chyuan-Haur; Lin, Hsiao-Yi
國立成功大學 2008-10-07 Effect of STI stress on leakage and V-ccmin of a sub-65nm node low-power SRAM Lee, Tung-Hsing; Fang, Yean-Kuen; Chiang, Yen-Ting; Chiu, Hua-Yueh; Chen, Ming-Shing; Cheng, Osbert
國立高雄大學 2008-10 Significant improvement of 45 nm and beyond complementary metal oxide semiconductor field effect transistor performance with fully silicided and ultimate spacer process technology Hsu, Chia-Wei; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan; Hsu, Che-Hua; Lai, Chieh-Ming; Cheng, Li-Wei; Ma, Mike
國立成功大學 2008-09-25 Improving hydrogen detecting performance of a Pd/n-LTPS/glass thin film Schottky diode with a TiO2 interface layer Chou, Tse-Heng; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, Cheng-I; Lin, Kung-Cheng
國立成功大學 2008-09-15 A low cost n-SiCN/p-SiCN homojunction for high temperature and high gain ultraviolet detecting applications Chou, Tse-Heng; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, Cheng-I; Yang, Che-Yun
國立成功大學 2008-09-15 GaN UV MSM photodetector on porous beta-SiC/(111)Si substrates Chang, Shiuan-Ho; Fang, Yean-Kuen; Hsu, Kai-Chun; Wei, Tzu-Chieh
國立成功大學 2008-09-01 Significant improvement of 45 nm and beyond complementary metal oxide semiconductor field effect transistor performance with fully silicided and ultimate spacer process technology Hsu, Chia-Wei; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan; Hsu, Che-Hua; Lai, Chieh-Ming; Cheng, Li-Wei; Ma, Mike
國立成功大學 2008-09-01 Strain effect and channel length dependence of bias temperature instability on complementary metal-oxide-semiconductor field effect transistors with high-k/SiO2 gate stacks Liao, J. C.; Fang, Yean-Kuen; Hou, Y. T.; Hung, C. L.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S.
國立成功大學 2008-08 A high current gain gate-controlled lateral bipolar junction transistor with 90 nm CMOS technology for future RF SoC applications Chen, Shuo-Mao; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, I. C.; Chiang, Yen-Ting
國立高雄大學 2008-07 Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting
國立成功大學 2008-06 Investigation and modeling of hot carrier effects on performance of 45-and 55-nm NMOSFETs with RF automatic measurement Tang, Mao-Chyuan; Fang, Yean-Kuen; Liao, Wen-Shiang; Chen, David C.; Yeh, Chune-Sin; Chien, Shan-Chieh
國立成功大學 2008-05 Dynamic negative bias temperature instability (NBTI) of low-temperature polycrystalline silicon (LTPS) thin-film transistors Liao, J. C.; Fang, Yean-Kuen; Kao, C. H.; Cheng, C. Y.
國立成功大學 2008-05 Investigation of bulk traps enhanced gate-induced leakage current in Hf-based MOSFETs Liao, Jia-Ching; Fang, Yean-Kuen; Hou, Y. T.; Tseng, W. H.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S.
國立成功大學 2008-04-30 Observations in trapping characteristics of positive bias temperature instability on high-k/metal gate n-type metal oxide semiconductor field effect transistor with the complementary multi-pulse technique Liao, J. C.; Fang, Yean-Kuen; Hou, Y. T.; Wu, W. H.; Hung, C. L.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S.
國立成功大學 2008-04 Observation of reliability of HfZrOX gate dielectric devices with different Zr/Hf ratios Liao, Jing-Chyi; Fang, Yean-Kuen; Hou, Yong Tian; Tseng, Wei Hsiung; Yang, Chih I.; Hsu, Peng Fu; Chao, Yuen Shun; Lin, Kang Cheng; Huang, Kuo Tai; Lee, Tzu Liang; Liang, Meng Sung
國立成功大學 2008-04 Effect of etch stop layer stress on negative bias temperature instability of deep submicron p-type metal-oxide-semiconductor field effect transistors with dual gate oxide Chen, Ming-Shing; Fang, Yean-Kuen; Lee, Tung-Hsing; Lin, Chien-Ting; Chiang, Yen-Ting; Ko, Joe; Sheu, Yau Kae; Shen, Tsong Lin; Liao, Wen Yi
國立成功大學 2008-03-31 Impact of the strained SiGe source/drain on hot carrier reliability for 45 nm p-type metal-oxide-semiconductor field-effect transistors Cheng, C. Y.; Fang, Yean-Kuen; Hsieh, J. C.; Hsia, H.; Chen, W. M.; Lin, S. S.; Hou, C. S.
國立成功大學 2008-02-21 Mechanism and modelling of source/drain asymmetry variation in 65nm CMOS devices for SRAM and logic applications Lee, Tung-Hsing; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, C. T.; Chen, Ming-Shing; Cheng, Osbert
國立成功大學 2008-02 Observation of room temperature negative differential resistance (NDR) in organic light-emitting diode with inorganic dopant Fang, Yean-Kuen; Chiang, Yen-Ting; Chen, Shih-Fang; Lin, Chun-Yu; Hou, Shul-Ching; Hung, Chih-Sheng; Tsai, Tzong-Yow; Chang, Shiuan-Ho; Chou, Tse-Heng
國立成功大學 2008-02 A novel electrochromic device with high optical switching speed Fang, Yean-Kuen; Chou, Tse-Heng; Lin, Chun-Yu; Chiang, Yen-Ting; Chen, Shih-Fang; Yang, Che-Yun; Chang, Shiuan-Ho; Lin, Chun-Sheng
國立高雄大學 2008 A high current gain gate-controlled lateral bipolar junction transistor with 90 nm CMOS technology for future RF SoC applications Chen, Shuo-Mao; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, I.C.; Chiang, Yen-Ting
國立成功大學 2007-10 A novel STI etching technology to mitigate an inverse narrow width effect, and improve device performances for 90 nm node and beyond CMOS technology Chiu, Hua-Yueh; Fang, Yean-Kuen; Chou, T. H.; Chiang, Yen-Ting; Lin, C. I.
國立成功大學 2007-09 CMOS dual-work-function engineering by using implanted Ni-FUSI Lin, Chien-Ting; Ramin, Manfred; Pas, Michael; Wise, Rick; Fang, Yean-Kuen; Hsu, Che-Hua; Huang, Yao-Tsung; Cheng, Li-Wei; Ma, Mike
國立高雄大學 2007-05 Impacts of notched-gate structure on contact etch stop layer (CESL) stressed 90-nm nMOSFET Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lai, Chieh-Ming; Hsu, Che-Hua; Cheng, Li-Wei; Ma, Guang-Hwa
國立成功大學 2007-05 Impacts of notched-gate structure on contact etch stop layer (CESL) stressed 90-nm nMOSFET Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lai, Chieh-Ming; Hsu, Che-Hua; Cheng, Li-Wei; Ma, Guang-Hwa
國立成功大學 2007-05 Investigation and localization.of the SiGe source/drain (S/D) strain-induced defects in PMOSFET with 45-nm CMOS technology Cheng, C. Y.; Fang, Yean-Kuen; Hsieh, J. C.; Hsia, H.; Sheu, Y. M.; Lu, W. T.; Chen, W. M.; Lin, S. S.
國立高雄大學 2007-04-30 Efficient mobility enhancement engineering on 65 nm fully silicide complementary metal-oxide-semiconductor field-effect-transistors using second contect etch stop layer process Lai, Chieh-Ming; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan
國立成功大學 2007-04 Efficient mobility enhancement engineering on 65 nm fully silicide complementary metal-oxide-semiconductor field-effect-transistors using second contect etch stop layer process Lai, Chieh-Ming; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan
國立成功大學 2007-04 Extra bonus on transistor optimization with stress enhanced notched-gate technology for sub-90 nm complementary metal oxide semiconductor field effect transistor Lin, Chien-Ting; Fang, Yean-Kuen; Lai, Chieh-Ming; Yeh, Wen-Kuan; Hsu, Che-Hua; Cheng, Li-Wei; Huang, Yao-Tsung; Ma, Guang Hwa
國立成功大學 2007-02-26 Enhancing the crystallization fraction performance of nano-crystalline silicon thin films with argon and hydrogen annealing Chen, S. F.; Fang, Yean-Kuen; Lee, T. H.; Lin, C. Y.; Lin, P. J.; Chang, S. H.; Chou, T. H.
國立高雄大學 2007-02 A novel strain method for enhancement of 90-nm node and beyond FUSI-gated CMOS performance Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, Tung-Hsing; Chen, Ming-Shing; Lai, Chieh-Ming; Hsu, Che-Hua; Chen, Liang-Wei; Cheng, Li-Wei; Ma, Mike
國立高雄大學 2007-02 The investigation of post-annealing-induced defects behavior on 90-nm in halo nMOSFETs with low-frequency noise and charge-pumping measuring Lai, Chieh-Ming; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting; Chou, T.H.
國立成功大學 2007-02 The investigation of post-annealing-induced defects behavior on 90-nm in halo nMOSFETs with low-frequency noise and charge-pumping measuring Lai, Chieh-Ming; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, C. T.; Chou, T. H.
國立成功大學 2007-02 A novel strain method for enhancement of 90-nm node and beyond FUSI-gated CMOS performance Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, Tung-Hsing; Chen, Ming-Shing; Lai, Chieh-Ming; Hsu, Che-Hua; Chen, Liang-Wei; Cheng, Li-Wei; Ma, Mike
國立成功大學 2007-02 Mechanism of chemical mechanical planarization induced edge corrosion of copper line for Cu/Low-k SiOC interconnects Hsu, Yung-Lung; Fang, Yean-Kuen; Chiang, Yen-Ting; Chou, Tse-Heng; Hong, Franklin Chau-Nan
國立成功大學 2007-01-08 Ultra high performance planar InGaAsPIN photodiodes for high speed optical fiber communication Chang, Shiuan-Ho; Fang, Yean-Kuen; Ting, Shyh-Fann; Chen, Shih-Fang; Lin, Chun-Yue; Wu, Cheng-Yi
國立成功大學 2007 A comparative study of SiCN/si and SiCN/SiCN junctions for high-temperature ultraviolet detecting applications Chou, Tse-Heng; Fang, Yean-Kuen; Yang, Che-Yun; Chiang, Yen-Ting; Shie, Jin-Shu; Chien, Chia-Chen
國立成功大學 2006-12 Effect of silicon thickness on contact-etch-stop-layer-induced silicon/buried-oxide interface stress for partially depleted SOI Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, Tung-Hsing; Chen, Ming-Shing; Hsu, Che-Hua; Chen, Liang-Wei; Cheng, Li-Wei; Ma, Mike
國立成功大學 2006-11-15 Design and fabrication of a TiO2/nano-silicon composite visible light photocatalyst Lin, Chun-Yu; Fang, Yean-Kuen; Kuo, Che-Hao; Chen, Shih-Fang; Lin, Chun-Sheng; Chou, Tse-Heng; Lee, Yu-Hua; Lin, Jui-Che; Hwang, Sheng-Beng
國立成功大學 2006-11 The geometry effect of contact etch stop layer impact on device performance and reliability for 90-nm SOI nMOSFETs Lai, Chieh-Ming; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan
國立成功大學 2006-10 Poly- and single-crystalline h-GaN grown on SiCN/Si(100) and SiCN/Si(111) substrates by MOCVD Chang, Shiuan-Ho; Fang, Yean-Kuen; Ting, Shyh-Fann; Lin, Chun-Yue; Chen, Shih-Fang; Kuan, Hon; Liang, Chin-Yung
國立成功大學 2006-09-25 Enhancing photoluminescence of nanocrystalline silicon thin film with oxygen plasma oxidation Lin, Chun-Yu; Fang, Yean-Kuen; Chen, Shih-Fang; Chang, Shiuan-Ho; Chou, Tse-Heng
國立成功大學 2006-06 The impacts of high tensile stress CESL and geometry design on device performance and reliability for 90 nm SOI nMOSFETs Lai, Chieh-Ming; Fang, Yean-Kuen; Lin, Chien-Ting; Hsu, Chia-Wei; Yeh, Wen-Kuan
國立成功大學 2006-04 Investigation and modeling of stress interactions on 90 nm silicon on insulator complementary metal oxide semiconductor by various mobility enhancement approaches Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, Tung-Hsing; Chen, Ming-Hing; Hsu, Che-Hua; Chen, Liang-Wei; Chang, Hui-Chen; Tsai, Cheng-Tzung; Ma, Mike
國立成功大學 2006-04 Systematic analysis and modeling of on-chip spiral inductors for complementary metal oxide semiconductor radio frequency integrated circuits applications Tang, Mao-Chyuan; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, S. H.; Yeh, Ta-Hsun
國立成功大學 2006-04 Stress technology impact on device performances and reliability for (100) sub-90 nm silicon-on-insulator complementary metal-oxide-semiconductor field-effect-transistors Lai, Chieh-Ming; Fang, Yean-Kuen; Yeh, Wen-Kuan
國立成功大學 2006-02-25 Growth of nanocrystalline silicon thin film with layer-by-layer technique for fast photo-detecting applications Lin, Chun-Yu; Fang, Yean-Kuen; Ling, Shih-Fang; Lin, Ping-Chang; Lin, Chun-Sheng; Chou, Tse-Heng; Hwang, Jenn Shyong; Lin, Kuang I.
國立成功大學 2006-01 Preferential coalescence of nanocrystalline silicon on different film substrates Lin, C. Y.; Fang, Yean-Kuen; Chen, S. F.; Lin, C. S.; Chou, T. H.; Hwang, S. B.; Hwang, J. S.; Lin, K. I.

Showing items 36-85 of 182  (4 Page(s) Totally)
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