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"fang yean kuen"的相关文件
显示项目 81-105 / 182 (共8页)
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| 國立成功大學 |
2006-04 |
Investigation and modeling of stress interactions on 90 nm silicon on insulator complementary metal oxide semiconductor by various mobility enhancement approaches
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Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, Tung-Hsing; Chen, Ming-Hing; Hsu, Che-Hua; Chen, Liang-Wei; Chang, Hui-Chen; Tsai, Cheng-Tzung; Ma, Mike |
| 國立成功大學 |
2006-04 |
Systematic analysis and modeling of on-chip spiral inductors for complementary metal oxide semiconductor radio frequency integrated circuits applications
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Tang, Mao-Chyuan; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, S. H.; Yeh, Ta-Hsun |
| 國立成功大學 |
2006-04 |
Stress technology impact on device performances and reliability for (100) sub-90 nm silicon-on-insulator complementary metal-oxide-semiconductor field-effect-transistors
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Lai, Chieh-Ming; Fang, Yean-Kuen; Yeh, Wen-Kuan |
| 國立成功大學 |
2006-02-25 |
Growth of nanocrystalline silicon thin film with layer-by-layer technique for fast photo-detecting applications
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Lin, Chun-Yu; Fang, Yean-Kuen; Ling, Shih-Fang; Lin, Ping-Chang; Lin, Chun-Sheng; Chou, Tse-Heng; Hwang, Jenn Shyong; Lin, Kuang I. |
| 國立成功大學 |
2006-01 |
Preferential coalescence of nanocrystalline silicon on different film substrates
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Lin, C. Y.; Fang, Yean-Kuen; Chen, S. F.; Lin, C. S.; Chou, T. H.; Hwang, S. B.; Hwang, J. S.; Lin, K. I. |
| 國立高雄大學 |
2006 |
The impact of stress enhanced technology for sub-90nm SOI MOSFETs
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Yeh, Wen-Kuan; Lai, Chieh-Ming; Lin, Chien-Ting; Fang, Yean-Kuen |
| 國立成功大學 |
2006 |
Failure mechanism of electromigration in via sidewall for copper dual damascene interconnection
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Hsu, Y. L.; Fang, Yean-Kuen; Chiang, Yen-Ting; Chen, Shih-Fang; Lin, C. Y.; Chou, T. H.; Chang, S. H. |
| 國立成功大學 |
2005-12 |
Fabrication of very high quantum efficiency planar InGaAsPIN photodiodes through prebake process
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Chang, S. H.; Fang, Yean-Kuen; Ting, S. F.; Chen, S. F.; Lin, C. Y.; Lin, C. S.; Wu, C. Y. |
| 國立成功大學 |
2005-10 |
Reliability studies of Hf-doped and NH3-nitrided gate dielectric for advanced CMOS application
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Yang, Chih-Wei; Liang, M. S.; Fang, Yean-Kuen; Hou, T. H.; Yao, Liang-Gi; Chen, S. C.; Chen, S. F.; Lin, C. S.; Lin, C. Y.; Wang, W. D.; CHou, T. H.; Lin, P. J. |
| 國立成功大學 |
2005-09 |
Investigation and modeling of stress effects on the formation of cobalt salicide
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Hsu, Y. L.; Fang, Yean-Kuen; Fang, S. J.; Chu, P.; Ho, Y. |
| 國立成功大學 |
2005-09 |
A high-efficiency CMOS image sensor with air gap in situ MicroLens (AGML) fabricated by 0.18-/-mu m CMOS technology
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Tseng, Chien-Hsien; Yao, L. L.; Wang, Wen-De; Wang, Chung-Shu; Chen, Shih-Fang |
| 國立成功大學 |
2005-09 |
Effect of extrinsic impedance and parasitic capacitance on figure of merit of RF MOSFET
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Yeh, Wen-Kuan; Ku, Chao-Ching; Chen, Shuo-Mao; Fang, Yean-Kuen; Chao, C. P. |
| 國立成功大學 |
2005-08 |
Investigation of structure and properties of nanocrystalline silicon on various buffer layers
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Lin, C. Y.; Fang, Yean-Kuen; Chen, S. F.; Lin, C. S.; CHou, T. H.; Hwang, Sheng-Beng; HWang, Jeen-Shing; Lin, K. I. |
| 國立成功大學 |
2005-08 |
An effective method to improve the sensitivity of deep submicrometer CMOS image sensors
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Lin, J. S.; Wuu, Shou-Gwo; Chien, H. C.; Tseng, Chien-Hsien; Wang, Chung-Shu; Chen, Shih-Fang; Lin, Chun-Yue; Lin, Chun-Sheng; Chou, Tse-Heng |
| 國立成功大學 |
2005-05 |
Color mixing improvement of CMOS image sensor with air-gap-guard ring in deep-submicrometer CMOS technology
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, Chung-Shu; Lin, J. S.; Tseng, Chien-Hsien; Chen, Shih-Fang; Lin, Chun-Sheng; Lin, Chun-Yue |
| 國立成功大學 |
2005-04 |
The effect of doping iodine on organic light-emitting diode
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Chen, S. F.; Fang, Yean-Kuen; Hou, S. C.; Lin, C. Y.; Lin, C. S.; Chang, Wen-Rong; CHou, T. H. |
| 國立成功大學 |
2005-04 |
Width effect on hot-carrier-induced degradation for 90nm partially depleted SOICMOSFETs
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Lai, Chieh-Ming; Fang, Yean-Kuen; Pan, Shing-Tai; Yeh, Wen-Kuan |
| 國立成功大學 |
2005-03 |
A deep submicrometer CMOS process compatible high-Q air-gap solenoid inductor with laterally laid structure
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Lin, C. S.; Fang, Yean-Kuen; Chen, S. F.; Lin, C. Y.; Hsieh, Ming-Chun; Lai, C. M.; Chou, T. H.; Chen, C. H. |
| 國立高雄大學 |
2005 |
Stress technology impact on device performance and reliability for <100> sub-90nm SOI CMOSFETs
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Yeh, Wen-Kuan; Lai, Chieh-Ming; Lin, Chien-Ting; Fang, Yean-Kuen; Shiau, W.T. |
| 國立成功大學 |
2005 |
Improving boron-induced retardation of metal-induced lateral crystallization length by hydrogen treatment
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Chen, Shih-Fang; Fang, Yean-Kuen; Lin, Ping-Chang; Lee, Tsung-Han; Lin, Chun-Yu; Lin, Chun-Sheng; Chou, Tse-Heng |
| 國立成功大學 |
2004-06 |
Dramatic reduction of optical crosstalk in deep-submicrometer CMOS imager with air gap guard ring
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, Chung-Shu; Lin, J. S.; Tseng, Chien-Hsien; Chen, Shih-Fang; Lin, Chun-Sheng; Lin, Chun-Yue |
| 國立成功大學 |
2004-06 |
The effect of thermal treatment on device characteristic and reliability for sub-100-nm CMOSFETs
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Yeh, Wen-Kuan; Fang, Yean-Kuen; Chen, Mao-Chieh |
| 國立成功大學 |
2004-06 |
The mechanism and evaluation of hot-carrier-induced performance degradation in 0.18-/mu m CMOS image sensor
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, C. S.; Lin, J. S.; Tseng, C. H.; Chen, S. F.; Lin, C. S.; Lin, C. Y. |
| 國立成功大學 |
2004-05 |
Substrate noise-coupling characterization and efficient suppression in CMOS technology
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Yeh, Wen-Kuan; Chen, Shuo-Mao; Fang, Yean-Kuen |
| 國立成功大學 |
2004-03 |
The contact characteristics of SiCN films for opto-electrical devices applications
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Chang, Wen-Rong; Fang, Yean-Kuen; Ting, Shyh-Fann; Chen, Shih-Fang; Lin, Chun-Yu; Hwang, Sheng-Beng; Chang, Cheng-Nan |
显示项目 81-105 / 182 (共8页)
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