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"fang yean kuen"的相關文件
顯示項目 111-135 / 182 (共8頁)
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| 國立成功大學 |
2003-10-30 |
Low temperature grown poly-SiGe thin film by Au metal-induced lateral crystallisation (MILIC) with fast MILC growth rate
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Chen, S. F.; Fang, Yean-Kuen; Wang, W. D.; Lin, C. Y.; Lin, C. S. |
| 國立成功大學 |
2003-10-16 |
Hf-doped and NH3-nitrided high-K gate dielectric thin film with least drain current degradation and flatband voltage shift
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Yang, Chih-Wei; Fang, Yean-Kuen; Lin, C. S.; Tsair, Y. S.; Chen, Shi-Ming; Wang, W. D.; Wang, M. F.; Cheng, Juing-Yi; Chen, C. H.; Yao, Liang-Gi; Chen, S. C.; Liang, M. S. |
| 國立成功大學 |
2003-09-18 |
Enhancing circuit design flexibility with argon implanted polysilicon resistor
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Lin, C. S.; Fang, Yean-Kuen; Chen, S. F.; Lin, C. Y.; Hsieh, M. C.; Hsu, Y. L.; HSu, Szu-Lin |
| 國立成功大學 |
2003-09 |
The hetero-epitaxial SiCN/Si MSM photodetector for high-temperature deep-UV detecting applications
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Chang, Wen-Rong; Fang, Yean-Kuen; Ting, Shyh-Fann; Tsair, Yong-Shiuan; Chang, Cheng-Nan; Lin, Chun-Yu; Chen, Shih-Fang |
| 國立成功大學 |
2003-07-14 |
Effect of polycrystalline-silicon gate types on the opposite flatband voltage shift in n-type and p-type metal-oxide-semiconductor field-effect transistors for high-k-HfO2 dielectric
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Yang, Chih-Wei; Fang, Yean-Kuen; Chen, C. H.; Chen, S. F.; Lin, C. Y.; Lin, C. S.; Wang, M. F.; Lin, Y. M.; Hou, T. H.; Chen, C. H.; Yao, Liang-Gi; Chen, S. C.; Liang, M. S. |
| 國立成功大學 |
2003-07-08 |
Method of growing single crystal gallium nitride on silicon substrate
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Fang, Yean-Kuen; Chang, Wen-Rong; Ting, Shyh-Fann; Kuan, Hon; Chang, Cheng-Nan |
| 國立成功大學 |
2003-06 |
Dramatic improving luminous efficiency of organic light emitting diodes under low driving current using nitrogen doped hole transporter
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Lee, W. J.; Fang, Yean-Kuen; Chiang, Hsin-Che; Ting, S. F.; Chen, S. F.; Chang, W. R.; Lin, C. Y.; Lin, T. Y.; Ho, J. J. |
| 國立成功大學 |
2003-05 |
Using diode-stacked NMOS as high voltage tolerant ESD protection device for analog applications in deep submicron CMOS technologies
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Chen, C. H.; Fang, Yean-Kuen; Wang, Wen-De; Tsai, Chien-Chun; Tu, Shen; Chen, MarkK.L.; Chang, Mi-Chang |
| 國立成功大學 |
2003-05 |
Improving turn on voltage and driving voltage of organic electroluminescent devices with nitrogen doped electron transporter
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Lee, W. J.; Fang, Yean-Kuen; Chiang, Hsin-Che; Ting, S. F.; Chen, S. F.; Chang, W. R.; Lin, C. Y.; Lin, T. Y.; Wang, W. D.; Hou, S. C.; Ho, Jyh-Jier |
| 國立成功大學 |
2003-04-17 |
Crystal SiGeC far infrared sensor with temperature isolation improvement structure
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Hsieh, Ming-Chun; Fang, Yean-Kuen; Wu, Pei-Ming; Wang, Wen-De |
| 國立成功大學 |
2003-04-17 |
HfO2/HfSixOy high-K gate stack with very low leakage current for low-power poly-Si gated CMOS application
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Yang, Chih-Wei; Fang, Yean-Kuen; Chen, S. F.; Wang, M. F.; Hou, T. H.; Lin, Y. M.; Yao, Liang-Gi; Chen, S. C.; Liang, M. S. |
| 國立成功大學 |
2003-04 |
High performance 12 GHz enhancement-mode pseudomorphic HEMT prepared by He plus reactive ion etching
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Lin, C. S.; Fang, Yean-Kuen; Ting, S. F.; Wang, C. C.; Huang, H. K.; Wu, C. L.; Chang, C. S. |
| 國立成功大學 |
2003-04 |
Modeling of the gate leakage current reduction in MOSFET with ultra-thin nitrided gate oxide
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Yang, Chih-Wei; Fang, Yean-Kuen; Ting, S. F.; Chen, C. H.; Wang, W. D.; Lin, T. Y.; Wang, M. F.; Yu, M. C.; Chen, C. L.; Yao, Liang-Gi; Chen, S. C.; Yu, C. H.; Liang, M. S. |
| 國立成功大學 |
2003-04 |
Hot-carrier-induced degradation on 0.1 mu m partially depleted silicon-on-insulator complementary metal-oxide-semiconductor field-effect-transistor
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Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Yang, Fu-Liang |
| 國立成功大學 |
2003-03-06 |
Effective improvement of high-k Hf-silicate/silicon interface with thermal nitridation
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Yang, Chih-Wei; Fang, Yean-Kuen; Chen, Shih-Fang; Lin, Chun-Yu; Wang, Ming-Fang; Lin, Yeou-Ming; Hou, Tuo-Hung; Yao, Liang-Gi; Chen, Shih-Chang; Liang, Mong-Song |
| 國立成功大學 |
2003-02 |
A novel etching technology with reactive ion etching system for GaAs via-hole etching applications
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Lin, C. S.; Fang, Yean-Kuen; Ting, S. F.; Wu, C. L.; Chang, C. S. |
| 國立成功大學 |
2003-01 |
Improvement of short-channel characteristics of a 0.1-mu m PMOSFET with ultralow-temperature nitride spacer by using a novel oxide capped boron uphill treatment
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Yang, Chih-Wei; Fang, Yean-Kuen; Chen, C. H.; Wang, W. D.; Ting, S. F.; Cheng, J. Y.; Wang, M. F.; Chen, C. L.; Yao, Liang-Gi; Lee, T. L.; Chen, S. C.; Yu, C. H.; Liang, M. S. |
| 國立成功大學 |
2002-12 |
Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide
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Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Chen, Mao-Chieh; Yang, Fu-Liang |
| 國立成功大學 |
2002-12 |
Optimizing indium tin oxide thin films with bipolar d.c.-pulsed magnetron sputtering for electrochromic device applications
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Lee, William J.; Fang, Yean-Kuen; Ho, Jyh-Jier; Chen, Chin-Ying; Chen, Shin-Fu; Tsai, Rung-Ywan; Huang, Daoyang; Ho, Fang C. |
| 國立成功大學 |
2002-11 |
Modeling of abnormal capacitance-voltage characteristics observed in MOS transistor with ultra-thin gate oxide
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Hsu, Yung-Lung; Fang, Yean-Kuen; Tsao, Feng-Cherng; Kuo, Fu-Jung; Ho, Yens |
| 國立成功大學 |
2002-11 |
Improving high temperature characteristic of SiGeC/Si heterojunction diode with propane carbon source
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Hsieh, Wen-Tse; Fang, Yean-Kuen; Ting, Shyh-Fann; Tsair, Yong-Shiuan; Lee, William J.; Wang, H. P. |
| 國立成功大學 |
2002-10 |
Heteroepitaxial silicon-carbide nitride films with different carbon sources on silicon substrates prepared by rapid-thermal chemical-vapor deposition
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Ting, Shyh-Fann; Fang, Yean-Kuen; Hsieh, Wen-Tse; Tsair, Yong-Shiuan; Chang, Chang-Nan; Lin, Chun-Sheng; Hsieh, Ming-Chun; Chiang, Hsin-Che; Ho, Jyh-Jier |
| 國立成功大學 |
2002-09-26 |
Dramatic reduction of gate leakage current in 1.61 nm HfO2 high-k dielectric poly-silicon gate with AI(2)O(3) capping layer
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Yang, Chih-Wei; Fang, Yean-Kuen; Chen, Chien-Hao; Wang, Wen-De; Lin, Tin-Yu; Wang, Ming-Fang; Hou, Tuo-Hung; Cheng, Juing-Yi; Yao, Liang-Gi; Chen, Shyh-Chang; Yu, Chen-Hua; Liang, Mong-Song |
| 國立成功大學 |
2002-07 |
Temperature dependence of hot-carrier-induced degradation in 0.1 mu m SOI nMOSFETs with thin oxide
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Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Yang, Fu-Liang |
| 國立成功大學 |
2002-05-01 |
New observations on hot-carrier degradation in 0.1 mu m silicon-on-insulator n-type metal oxide semiconductor field effect transistors
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Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Yang, Fu-Liang |
顯示項目 111-135 / 182 (共8頁)
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