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"fang yean kuen"的相關文件
顯示項目 31-40 / 182 (共19頁)
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| 國立成功大學 |
2009-05-07 |
Origins of flash lamp annealing induced p-n junction leakages in a 45 nm p-MOSFET with strained SiGe source/drain
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Cheng, C. Y.; Fang, Yean-Kuen; Hsieh, J. C.; Hsia, H.; Lin, S. S.; Hou, C. S.; Ku, K. C.; Sheu, Y. M. |
| 國立成功大學 |
2009-04 |
Hot-Carrier and Fowler-Nordheim (FN) Tunneling Stresses on RF Reliability of 40-nm PMOSFETs With and Without SiGe Source/Drain
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Tang, Mao-Chyuan; Fang, Yean-Kuen; Chen, David C.; Yeh, Chune-Sin |
| 國立成功大學 |
2009-04 |
Narrow Width and Length Dependence of SiGe and Sallow-Trench-Isolation Stress Induced Defects in 45 nm p-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Strained SiGe Source/Drain
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Cheng, Chung-Yun; Fang, Yean-Kuen; Hsieh, Jang-Cheng; Sheu, Yi-Ming; Hsia, Harry; Chen, Wei-Ming; Lin, Shyue-Shyh; Hou, Chin-Shan |
| 國立成功大學 |
2008-11-21 |
Effect of hot carrier stress on RF reliability of 40 nm PMOSFETs with and without SiGe source/drain
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Tang, Mao-Chyuan; Fang, Yean-Kuen; Wei, Sun-Chin; Chen, David C.; Yeh, Chune-Sin; Huang-Lu, Shiang |
| 國立成功大學 |
2008-11-10 |
The influence of nitrogen incorporation on performance and bias temperature instability of metal oxide semiconductor field effect transistors with ultrathin high-k gate stacks
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Liao, Jia-Ching; Fang, Yean-Kuen; Chen, C. H.; Hou, Y. T.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S. |
| 國立成功大學 |
2008-11 |
Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer
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Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting |
| 國立成功大學 |
2008-11 |
Effect of the pre-gate oxide cleaning temperature on the reliability of GOI and devices performances in deep submicron CMOS technology
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Chiang, Yen-Ting; Fang, Yean-Kuen; Huang, Y. J.; Chou, T. H.; Yeh, S. Y.; Lin, C. S. |
| 國立成功大學 |
2008-11 |
The Pd/TiO2/n-LTPS Thin-Film Schottky Diode on Glass Substrate for Hydrogen Sensing Applications
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Chou, Tse-Heng; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, Kung-Cheng; Lin, Cheng-I; Kao, Chyuan-Haur; Lin, Hsiao-Yi |
| 國立成功大學 |
2008-10-07 |
Effect of STI stress on leakage and V-ccmin of a sub-65nm node low-power SRAM
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Lee, Tung-Hsing; Fang, Yean-Kuen; Chiang, Yen-Ting; Chiu, Hua-Yueh; Chen, Ming-Shing; Cheng, Osbert |
| 國立高雄大學 |
2008-10 |
Significant improvement of 45 nm and beyond complementary metal oxide semiconductor field effect transistor performance with fully silicided and ultimate spacer process technology
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Hsu, Chia-Wei; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan; Hsu, Che-Hua; Lai, Chieh-Ming; Cheng, Li-Wei; Ma, Mike |
顯示項目 31-40 / 182 (共19頁)
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