|
|
???tair.name??? >
???browser.page.title.author???
|
"fang yean kuen"???jsp.browse.items-by-author.description???
Showing items 141-165 of 182 (8 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 > >>
View [10|25|50] records per page
| 國立成功大學 |
2002-04 |
Determination of deep ultrathin equivalent oxide thickness (EOT) from measuring flat-band C-V curve
|
Chen, Chung-Hui; Fang, Yean-Kuen; Yang, Chih-Wei; Ting, Shyh-Fann; Tsair, Yong-Shiuan; Wang, Ming-Fang; Yao, Liang-Gi; Chen, S. C.; Yu, Chen-Hua; Liang, Mong-Song |
| 國立成功大學 |
2002-04 |
Cu3Ge Schottky contacts on n-GaN
|
Hsin, Hui-Ching; Lin, Wen-Tai; Gong, J. R.; Fang, Yean-Kuen |
| 國立成功大學 |
2002-03 |
A high breakdown-voltage SiCN/Si heterojunction diode for high-temperature applications
|
Ting, Shyh-Fann; Fang, Yean-Kuen; Hsieh, Wen-Tse; Tsair, Yong-Shiuan; Chang, Cheng-Nan; Lin, Chun-Sheng; Hsieh, Ming-Chun; Chiang, Hsin-Che; Ho, Jyh-Jier |
| 國立成功大學 |
2002-02 |
Pulsed-magnetron-sputtered low-temperature indium tin oxide films for flat-panel display applications
|
Lee, William J.; Fang, Yean-Kuen; Ho, Jyh-Jier; Chen, Chin-Ying; Tsai, Rung-Ywan; Huang, Dao-Yang; Ho, Fang C.; Chou, H. W.; Chen, C. C. |
| 國立成功大學 |
2001-12 |
To optimize electrical properties of the ultrathin (1.6 nm) nitride/oxide gate stacks with bottom oxide materials and post-deposition treatment
|
Chen, Chein-Hao; Fang, Yean-Kuen; Yang, Chih-Wei; Ting, Shyh-Fann; Tsair, Yong-Shiuan; Wang, Ming-Fang; Hou, Tuo-Hong; Yu, Mo-Chiun; Chen, Shih-Chang; Jang, Syun-Ming; Yu, D. C. H.; Liang, Mong-Song |
| 國立成功大學 |
2001-11 |
A deep submicron CMOS process compatible suspending high-Q inductor
|
Chen, Chung-Hui; Fang, Yean-Kuen; Yang, Chih-Wei; Tang, C. S. |
| 國立成功大學 |
2001-11 |
Nitrogen implanted polysilicon resistor for high-voltage CMOS technology application
|
Chen, Chung-Hui; Fang, Yean-Kuen; Yang, Chih-Wei; Wang, Ta-Wei; Hsu, Yung-Lung; Hsu, Shun-Liang |
| 國立成功大學 |
2001-11 |
Cubic single-crystalline Si1-x-yCxNy films with mirror face prepared by RTCVD
|
Ting, Shyh-Fann; Fang, Yean-Kuen; Hsieh, Wen-Tse; Tsair, Yong-Shiuan; Chang, Cheng-Nan; Lin, Chun-Sheng; Hsieh, Ming-Chun; Chiang, Hsin-Che; Ho, Jyh-Jier |
| 國立成功大學 |
2001-10-25 |
Origins and effects of radical-induced re-oxidation in ultra-thin remote plasma nitrided oxides
|
Chen, Chung-Hui; Fang, Yean-Kuen; Hsieh, Wen-Tse; Ting, Shyh-Fann; Yu, Mo-Chiun; Wang, Ming-Fang; Chen, C. L.; Yao, Liang-Gi; Chen, S. C.; Yu, Chen-Hua; Liang, Mong-Song |
| 國立成功大學 |
2001-08 |
Thermally-enhanced remote plasma nitrided ultrathin (1.65 nm) gate oxide with excellent performances in reduction of leakage current and boron diffusion
|
Chen, Chung-Hui; Fang, Yean-Kuen; Yang, Chih-Wei; Ting, Shyh-Fann; Tsair, Yong-Shiuan; Yu, Mo-Chiun; Hou, Tuo-Hung; Wang, Ming-Fang; Chen, S. C.; Yu, Chen-Hua; Liang, Mong-Song |
| 國立成功大學 |
2001-07 |
The effect of remote plasma nitridation on the integrity of the ultrathin gate dielectric films in 0.13 mu m CMOS technology and beyond
|
Ting, Shyh-Fann; Fang, Yean-Kuen; Chen, Chung-Hui; Yang, Chih-Wei; Hsieh, Wen-Tse; Ho, Jyh-Jier; Yu, Mo-Chiun; Jang, Syun-Ming; Yu, Chen-Hua; Liang, Mong-Song; Chen, S; Shih, R |
| 國立成功大學 |
2001-06-07 |
He plus remote plasma nitridation of ultra-thin gate oxide for deep submicron CMOS technology applications
|
Ting, Shyh-Fann; Fang, Yean-Kuen; Chen, Chien-Hao; Yang, Chih-Wei; Yu, Mo-Chiun; Jang, Syun-Ming; Yu, Chen-Hua; Liang, Mong-Song; Chen, Sun-Way; Shih, R. |
| 國立成功大學 |
2001-06 |
High-quality ultrathin (1.6 nm) nitride/oxide stack gate dielectrics prepared by combining remote plasma nitridation and LPCVD technologies
|
Chen, Chung-Hui; Fang, Yean-Kuen; Yang, Chih-Wei; Ting, Shyh-Fann; Tsair, Yong-Shiuan; Wang, Ming-Fang; Lin, Yu-Min; Yu, Mo-Chiun; Chen, S. C.; Yu, Chen-Hua; Liang, Mong-Song |
| 國立成功大學 |
2001-04 |
Using porous silicon as semi-insulating substrate for beta-SiC high temperature optical-sensing devices
|
Hsieh, Wen-Tse; Fang, Yean-Kuen; Wu, Kuen-Hsien; Lee, William J.; Ho, Jyh-Jier; Ho, Chi-Wei |
| 國立成功大學 |
2001-03 |
Effects of post-deposition treatments on ultrathin nitride/oxide gate stack prepared by RTCVD for ULSI devices
|
Chen, Chung-Hui; Fang, Yean-Kuen; Yang, Chih-Wei; Ting, Shyh-Fann; Tsair, Yong-Shiuan; Wang, Ming-Fang; Chen, S. C.; Yu, Chen-Hua; Liang, Mong-Song |
| 國立成功大學 |
2001-03 |
A contact-type piezoresistive micro-shear stress sensor for above-knee prosthesis application
|
Hsieh, Ming-Chun; Fang, Yean-Kuen; Ju, Ming-Shaung; Chen, Gin-Shin; Ho, Jyh-Jier; Yang, C. H.; Wu, Pei-Ming; Wu, G. S.; Chen, Terry Yuan-Fang |
| 國立成功大學 |
2001-02-01 |
Subthreshold characteristics of submicrometer polysilicon thin film transistor
|
Yaung, Dun-Nian; Fang, Yean-Kuen; Huang, Kuo-Ching; Wang, Y. J.; Hung, C. C.; Liang, Mong-Song; Wuu, Shou-Gwo |
| 國立成功大學 |
2001-02 |
A novel programming technique for highly scalable and disturbance immune flash EEPROM
|
Huang, Kuo-Ching; Fang, Yean-Kuen; Yaung, Dun-Nian; Chen, Chung-Hui; Hsu, Yung-Lung; Ting, Shyh-Fann; Lin, Yvonne; Kuo, Di-son; Wang, Chung S.; Liang, Mong-Song |
| 國立成功大學 |
2001-02 |
Nonsilicide source/drain pixel for 0.25-mu m CMOS image sensor
|
Yaung, Dun-Nian; Wuu, Shou-Gwo; Fang, Yean-Kuen; Wang, Chung-Shu; Tseng, Chien-Hsien; Liang, Mon-Song |
| 國立成功大學 |
2001-01-01 |
A novel multi-level interconnect scheme with air as low K inter-metal dielectric for ultradeep submicron application
|
Chen, Chung-Hui; Fang, Yean-Kuen; Lin, Chun-Sheng; Yang, Chih-Wei; Hsieh, Jang-Cheng |
| 國立成功大學 |
2001-01 |
To suppress photoexcited current of hydrogenated polysilicon TFTs with low temperature oxidation of polychannel
|
Yaung, Dun-Nian; Fang, Yean-Kuen; Chen, Chung-Hui; Hung, C. C.; Tsao, F. C.; Wuu, Shou-Gwo; Liang, Mong-Song |
| 國立成功大學 |
2000-11-01 |
High performance submicron bottom gate TFTs with self aligned Ti-silicide interpoly contact and poly-channel oxidation for high-density SRAM
|
Yaung, Dun-Nian; Fang, Yean-Kuen; Huang, Kuo-Ching; Chen, Chin-Ying; Wang, Y. J.; Hung, C. C.; Wuu, Shou-Gwo; Liang, Mong-Song |
| 國立成功大學 |
2000-10-30 |
Effects of monolithic silicon postulated as an isotropic material on design of microstructures
|
Chen, Gin-Shin; Ju, Ming-Shaung; Fang, Yean-Kuen |
| 國立成功大學 |
2000-10-26 |
To suppress dark current of high temperature beta-SiC/Si optoelectronic devices with porous silicon substrate
|
Hsieh, Wen-Tse; Fang, Yean-Kuen; Lee, William J.; Ho, Chi-Wei; Wu, Kuen-Hsien; Ho, Jyh-Jier |
| 國立成功大學 |
2000-10 |
A DC current stress method to improve the voltage coefficient of resistance of the polysilicon resistor in high voltage CMOS technology
|
Chen, Chung-Hui; Fang, Yean-Kuen; Kuo, Mao-Hsiung; Hsu, Yung-Lung; Hsu, Shun-Liang |
Showing items 141-165 of 182 (8 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 > >>
View [10|25|50] records per page
|
