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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Showing items 26-50 of 182  (8 Page(s) Totally)
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Institution Date Title Author
國立成功大學 2009-08 The effects of STI induced mechanical strain on GIDL current in Hf-based and SiON MOSFETs Cheng, C. Y.; Fang, Yean-Kuen; Liao, J. C.; Wang, T. J.; Hou, Y. T.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S.
國立成功大學 2009-08 New Observations in LOD Effect of 45-nm P-MOSFETs With Strained SiGe Source/Drain and Dummy Gate Cheng, Chung-Yun; Fang, Yean-Kuen; Hsieh, Jang-Cheng; Yang, Sheng-Jier; Sheu, Yi-Ming; Hsia, Harry
國立高雄大學 2009-07 Effect of Nitrogen Incorporation in a Gd Cap Layer on the Reliability of Deep-Submicrometer Hf-Based High-k/Metal-Gate nMOSFETs Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, Chun-Yu; Lin, Chien-Ting; Hsu, Che-Hua; Cheng, Li-Wei; Lai, Chien-Ming
國立成功大學 2009-07 Effect of Nitrogen Incorporation in a Gd Cap Layer on the Reliability of Deep-Submicrometer Hf-Based High-k/Metal-Gate nMOSFETs Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, Chun-Yu; Lin, Chien-Ting; Hsu, Che-Hua; Cheng, Li-Wei; Lai, Chien-Ming
國立成功大學 2009-07 N-SiCN/P-Silicon Heterojunction With Porous Silicon Buffer Layer for Low-Cost and High-Temperature Ultraviolet (UV) Detecting Applications Chiang, Yen-Ting; Fang, Yean-Kuen; Chou, Tse-Heng; Lin, Cheng-I; Juang, Feng-Renn; Kuo, Ta-Wei; Wu, Kuen-Hsien; Ho, Mingtsu; Shie, Jin-Shu
國立成功大學 2009-05-07 Origins of flash lamp annealing induced p-n junction leakages in a 45 nm p-MOSFET with strained SiGe source/drain Cheng, C. Y.; Fang, Yean-Kuen; Hsieh, J. C.; Hsia, H.; Lin, S. S.; Hou, C. S.; Ku, K. C.; Sheu, Y. M.
國立成功大學 2009-04 Hot-Carrier and Fowler-Nordheim (FN) Tunneling Stresses on RF Reliability of 40-nm PMOSFETs With and Without SiGe Source/Drain Tang, Mao-Chyuan; Fang, Yean-Kuen; Chen, David C.; Yeh, Chune-Sin
國立成功大學 2009-04 Narrow Width and Length Dependence of SiGe and Sallow-Trench-Isolation Stress Induced Defects in 45 nm p-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Strained SiGe Source/Drain Cheng, Chung-Yun; Fang, Yean-Kuen; Hsieh, Jang-Cheng; Sheu, Yi-Ming; Hsia, Harry; Chen, Wei-Ming; Lin, Shyue-Shyh; Hou, Chin-Shan
國立成功大學 2008-11-21 Effect of hot carrier stress on RF reliability of 40 nm PMOSFETs with and without SiGe source/drain Tang, Mao-Chyuan; Fang, Yean-Kuen; Wei, Sun-Chin; Chen, David C.; Yeh, Chune-Sin; Huang-Lu, Shiang
國立成功大學 2008-11-10 The influence of nitrogen incorporation on performance and bias temperature instability of metal oxide semiconductor field effect transistors with ultrathin high-k gate stacks Liao, Jia-Ching; Fang, Yean-Kuen; Chen, C. H.; Hou, Y. T.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S.
國立成功大學 2008-11 Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting
國立成功大學 2008-11 Effect of the pre-gate oxide cleaning temperature on the reliability of GOI and devices performances in deep submicron CMOS technology Chiang, Yen-Ting; Fang, Yean-Kuen; Huang, Y. J.; Chou, T. H.; Yeh, S. Y.; Lin, C. S.
國立成功大學 2008-11 The Pd/TiO2/n-LTPS Thin-Film Schottky Diode on Glass Substrate for Hydrogen Sensing Applications Chou, Tse-Heng; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, Kung-Cheng; Lin, Cheng-I; Kao, Chyuan-Haur; Lin, Hsiao-Yi
國立成功大學 2008-10-07 Effect of STI stress on leakage and V-ccmin of a sub-65nm node low-power SRAM Lee, Tung-Hsing; Fang, Yean-Kuen; Chiang, Yen-Ting; Chiu, Hua-Yueh; Chen, Ming-Shing; Cheng, Osbert
國立高雄大學 2008-10 Significant improvement of 45 nm and beyond complementary metal oxide semiconductor field effect transistor performance with fully silicided and ultimate spacer process technology Hsu, Chia-Wei; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan; Hsu, Che-Hua; Lai, Chieh-Ming; Cheng, Li-Wei; Ma, Mike
國立成功大學 2008-09-25 Improving hydrogen detecting performance of a Pd/n-LTPS/glass thin film Schottky diode with a TiO2 interface layer Chou, Tse-Heng; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, Cheng-I; Lin, Kung-Cheng
國立成功大學 2008-09-15 A low cost n-SiCN/p-SiCN homojunction for high temperature and high gain ultraviolet detecting applications Chou, Tse-Heng; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, Cheng-I; Yang, Che-Yun
國立成功大學 2008-09-15 GaN UV MSM photodetector on porous beta-SiC/(111)Si substrates Chang, Shiuan-Ho; Fang, Yean-Kuen; Hsu, Kai-Chun; Wei, Tzu-Chieh
國立成功大學 2008-09-01 Significant improvement of 45 nm and beyond complementary metal oxide semiconductor field effect transistor performance with fully silicided and ultimate spacer process technology Hsu, Chia-Wei; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan; Hsu, Che-Hua; Lai, Chieh-Ming; Cheng, Li-Wei; Ma, Mike
國立成功大學 2008-09-01 Strain effect and channel length dependence of bias temperature instability on complementary metal-oxide-semiconductor field effect transistors with high-k/SiO2 gate stacks Liao, J. C.; Fang, Yean-Kuen; Hou, Y. T.; Hung, C. L.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S.
國立成功大學 2008-08 A high current gain gate-controlled lateral bipolar junction transistor with 90 nm CMOS technology for future RF SoC applications Chen, Shuo-Mao; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, I. C.; Chiang, Yen-Ting
國立高雄大學 2008-07 Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting
國立成功大學 2008-06 Investigation and modeling of hot carrier effects on performance of 45-and 55-nm NMOSFETs with RF automatic measurement Tang, Mao-Chyuan; Fang, Yean-Kuen; Liao, Wen-Shiang; Chen, David C.; Yeh, Chune-Sin; Chien, Shan-Chieh
國立成功大學 2008-05 Dynamic negative bias temperature instability (NBTI) of low-temperature polycrystalline silicon (LTPS) thin-film transistors Liao, J. C.; Fang, Yean-Kuen; Kao, C. H.; Cheng, C. Y.
國立成功大學 2008-05 Investigation of bulk traps enhanced gate-induced leakage current in Hf-based MOSFETs Liao, Jia-Ching; Fang, Yean-Kuen; Hou, Y. T.; Tseng, W. H.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S.

Showing items 26-50 of 182  (8 Page(s) Totally)
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