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"fang yean kuen"的相關文件
顯示項目 96-105 / 182 (共19頁)
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| 國立成功大學 |
2005-04 |
The effect of doping iodine on organic light-emitting diode
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Chen, S. F.; Fang, Yean-Kuen; Hou, S. C.; Lin, C. Y.; Lin, C. S.; Chang, Wen-Rong; CHou, T. H. |
| 國立成功大學 |
2005-04 |
Width effect on hot-carrier-induced degradation for 90nm partially depleted SOICMOSFETs
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Lai, Chieh-Ming; Fang, Yean-Kuen; Pan, Shing-Tai; Yeh, Wen-Kuan |
| 國立成功大學 |
2005-03 |
A deep submicrometer CMOS process compatible high-Q air-gap solenoid inductor with laterally laid structure
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Lin, C. S.; Fang, Yean-Kuen; Chen, S. F.; Lin, C. Y.; Hsieh, Ming-Chun; Lai, C. M.; Chou, T. H.; Chen, C. H. |
| 國立高雄大學 |
2005 |
Stress technology impact on device performance and reliability for <100> sub-90nm SOI CMOSFETs
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Yeh, Wen-Kuan; Lai, Chieh-Ming; Lin, Chien-Ting; Fang, Yean-Kuen; Shiau, W.T. |
| 國立成功大學 |
2005 |
Improving boron-induced retardation of metal-induced lateral crystallization length by hydrogen treatment
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Chen, Shih-Fang; Fang, Yean-Kuen; Lin, Ping-Chang; Lee, Tsung-Han; Lin, Chun-Yu; Lin, Chun-Sheng; Chou, Tse-Heng |
| 國立成功大學 |
2004-06 |
Dramatic reduction of optical crosstalk in deep-submicrometer CMOS imager with air gap guard ring
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, Chung-Shu; Lin, J. S.; Tseng, Chien-Hsien; Chen, Shih-Fang; Lin, Chun-Sheng; Lin, Chun-Yue |
| 國立成功大學 |
2004-06 |
The effect of thermal treatment on device characteristic and reliability for sub-100-nm CMOSFETs
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Yeh, Wen-Kuan; Fang, Yean-Kuen; Chen, Mao-Chieh |
| 國立成功大學 |
2004-06 |
The mechanism and evaluation of hot-carrier-induced performance degradation in 0.18-/mu m CMOS image sensor
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, C. S.; Lin, J. S.; Tseng, C. H.; Chen, S. F.; Lin, C. S.; Lin, C. Y. |
| 國立成功大學 |
2004-05 |
Substrate noise-coupling characterization and efficient suppression in CMOS technology
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Yeh, Wen-Kuan; Chen, Shuo-Mao; Fang, Yean-Kuen |
| 國立成功大學 |
2004-03 |
The contact characteristics of SiCN films for opto-electrical devices applications
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Chang, Wen-Rong; Fang, Yean-Kuen; Ting, Shyh-Fann; Chen, Shih-Fang; Lin, Chun-Yu; Hwang, Sheng-Beng; Chang, Cheng-Nan |
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