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| 國立成功大學 |
2002-12 |
Determination of depth profiles of Ni80Fe20 epifilms on Mo buffered Al2O3 substrates with and without a Co interlayer by polarized neutron and X-ray reflectivity
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Yu, Kuan-Li; Lee, Chih-Hao; Huang, Jung-Chun Andrew; Su, Hui-Chia; Felcher, G. P. |
| 國立成功大學 |
2000-02 |
The magnetic depth profile at the interface of a permalloy/Co thin film studied by polarized neutron and X-ray reflectivity
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Lee, Chih-Hao; Yu, Kuan-Li; Lee, Ming-Han; Huang, Jung-Chun Andrew; Felcher, G. P. |
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