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"feng amp z c"
Showing items 1-7 of 7 (1 Page(s) Totally)
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| 國立臺灣大學 |
1998-01 |
Spatial characterization of doped SiC wafers by Raman spectroscopy
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Burton, J.C.; Sun, L.; Pophristic, M.; Long, F.H.; Feng &, Z.C.; Ferguson, I. |
| 國立臺灣大學 |
1996-01 |
The wavequide study and the refractive indices of GaN:Mg epitaxial film
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Zhang, H.Y.; He, X.H.; Shih, Y.H.; Schurman, M.; Feng &, Z.C.; Stall, R.A. |
| 國立臺灣大學 |
1996-01 |
The study of nonlinear optical effects in GaN:Mg epitaxial film
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Zhang, H.Y.; He, X.H.; Shih, Y.H.; Schurman, M.; Feng &, Z.C.; Stall, R.A. |
| 國立臺灣大學 |
1994-01 |
Raman, FTIR and surface analyses of porous silicon membranes
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Feng &, Z.C.; Wee, A.T.S. |
| 國立臺灣大學 |
1988-01 |
Low temperature photoluminescence studies of CVD grown cubic SiC on Si
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Choyke, W.J.; Feng &, Z.C.; Powell, J.A. |
| 國立臺灣大學 |
1984-01 |
The stresses and photoelastic effects in GaAs-GaAlAs multilayer wafers with masked and selective thermal oxidation structure
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Liu, H.D.; Feng &, Z.C .; Guo, Z.Z. |
| 國立臺灣大學 |
1983-01 |
Curvature Radius and layer stresses for thermal strain in semiconductor multilayer structures
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Feng &, Z.C.; Liu, H.D. |
Showing items 1-7 of 7 (1 Page(s) Totally)
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