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机构 日期 题名 作者
國立交通大學 2014-12-08T15:02:38Z Growth and electrical characterization of Si delta-doped GaInP by low pressure metalorganic chemical vapor deposition Wang, CJ; Feng, MS; Chan, SH; Chang, CY; Wu, JH; Sze, SM
國立交通大學 2014-12-08T15:02:35Z Effects of the rear interface states and fixed charges on the electrical characteristics of thin film transistors with thin amorphous silicon layers Tai, YH; Su, FC; Feng, MS; Cheng, HC
國立交通大學 2014-12-08T15:02:34Z The dependence of the electrical characteristics of the GaN epitaxial layer on the thermal treatment of the GaN buffer layer Lin, CF; Chi, GC; Feng, MS; Guo, JD; Tsang, JS; Hong, JMH
國立交通大學 2014-12-08T15:02:34Z X-ray crystallographic study of GaN epitaxial films on Al2O3(0001) substrates with GaN buffer layers Lee, CH; Chi, GC; Lin, CF; Feng, MS; Guo, JD
國立交通大學 2014-12-08T15:02:33Z Analysis of influence of alkyl sources on deep levels in GaN by transient capacitance method Chen, JF; Chen, NC; Huang, WY; Lee, WI; Feng, MS
國立交通大學 2014-12-08T15:02:31Z Reactive ion etching of GaN with BCl3/SF6 plasmas Feng, MS; Guo, JD; Lu, YM; Chang, EY
國立交通大學 2014-12-08T15:02:26Z Schottky contact and the thermal stability of Ni on n-type GaN Guo, JD; Pan, FM; Feng, MS; Guo, RJ; Chou, PF; Chang, CY
國立交通大學 2014-12-08T15:01:58Z Chemical-mechanical polishing and material characteristics of plasma-enhanced chemically vapor deposited fluorinated oxide thin films Tseng, WT; Hsieh, YT; Lin, CF; Tsai, MS; Feng, MS
國立交通大學 2014-12-08T15:01:57Z Investigation of the indium atom interdiffusion on the growth of GaN/InGaN heterostructures Tsang, JS; Guo, JD; Chan, SH; Feng, MS; Chang, CY
國立交通大學 2014-12-08T15:01:46Z Mobility enhancements in AlGaN/GaN/SiC with stair-step and graded heterostructures Lin, CF; Cheng, HC; Huang, JA; Feng, MS; Guo, JD; Chi, GC
國立交通大學 2014-12-08T15:01:36Z Persistent photoconductivity in n-type GaN Chen, HM; Chen, YF; Lee, MC; Feng, MS
國立交通大學 2014-12-08T15:01:30Z Integration of modified plasma-enhanced chemical vapor deposited tetraethoxysilane intermetal dielectric and chemical-mechanical polishing processes for 0.35 mu m IC device reliability improvement Wang, YL; Tseng, WT; Feng, MS
國立交通大學 2014-12-08T15:01:28Z Growth and characterizations of GaN on SiC substrates with buffer layers Lin, CF; Cheng, HC; Chi, GC; Feng, MS; Guo, JD; Hong, JMH; Chen, CY
國立交通大學 2014-12-08T15:01:23Z Effects of underlying films on the chemical-mechanical polishing for shallow trench isolation technology Wang, YL; Liu, C; Feng, MS; Dun, JW; Chou, KS
國立交通大學 2014-12-08T15:01:23Z Chemical-mechanical polishing of low-dielectric-constant spin-on-glasses: film chemistries, slurry formulation and polish selectivity Wang, YL; Liu, C; Chang, ST; Tsai, MS; Feng, MS; Tseng, WT
國立交通大學 2014-12-08T15:01:15Z Characterization of GaN epitaxial layers on SiC substrates with AlxGa1-xN buffer layers Lin, CF; Cheng, HC; Feng, MS; Chi, GC
國立交通大學 2014-12-08T15:01:09Z The exothermic reaction and temperature measurement for tungsten CMP technology and its application on endpoint detection Wang, YL; Liu, C; Feng, MS; Tseng, WT
國立交通大學 2014-12-08T15:01:09Z A modified multi-chemicals spray cleaning process for post-CMP cleaning application Wang, YL; Liu, C; Feng, MS; Tseng, WT

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