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| 國立交通大學 |
2014-12-08T15:20:56Z |
Assessment of ESD Robustness in High Power Light-Emitting Diodes
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Yang, Shih-Chun; Lin, Pang; Fu, Han-Kuei; Wang, Chien-Ping; Chen, Tzung-Te; Lee, An-Tse; Huang, Sheng-Bang; Chou, Pei-Ting; Wang, Wei; Kao, Fu-Jen |
| 國立交通大學 |
2014-12-08T15:11:59Z |
Accelerated Degradation of High Power Light-Emitting Diode Resulted from Inhomogeneous Current Distribution
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Yang, Shih Chun; Lin, Pang; Fu, Han Kuei; Lee, An Tse; Chen, Tzung Te; Wang, Chien Ping; Huang, Sheng Bang; Chou, Pei Ting |
| 國立交通大學 |
2014-12-08T15:06:57Z |
Variation of Electrostatic Discharge Robustness Induced by the Surface Morphology of High Power Light-Emitting Diodes
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Yang, Shih Chun; Lin, Pang; Fu, Han Kuei; Wang, Chien Ping; Chen, Tzung Te; Lee, An Tse; Huang, Sheng Bang; Chu, Mu Tao |
| 淡江大學 |
2014-01 |
Analysis of Thermal Resistance Characteristics of Power LED Module
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Wang, Chien-Ping; Kang, Shung-Wen; Lin, Kuan-Min; Chen, Tzung-Te; Fu, Han-Kuei; Chou, Pei-Ting |
| 國立臺灣大學 |
2009 |
A thermal emitter with selective wavelength: Based on the coupling between photonic crystals and surface plasmon polaritons
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Fu, Han-Kuei; Jiang, Yu-Wei; Tsai, Ming-Wei; Lee, Si-Chen; Chen, Yang-Fang |
| 國立臺灣大學 |
2009 |
半導體上等效週期陣列與表面電漿子的光學性質研究
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傅瀚葵; Fu, Han-Kuei |
| 國立臺灣大學 |
2004 |
B→η(η′)K(π) in the standard model with flavor symmetry
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Fu, Han-Kuei; He, Xiao-Gang; Hsiao, Yu-Kuo |
| 國立臺灣大學 |
2003-12 |
CP Violation in B → PP Decays in the Standard Model with SU(3) Symmetry
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Fu, Han-Kuei; He, Xiao-Gang; Hsiao, Yu-Kuo; Shi, Jian-Qing |
| 臺大學術典藏 |
2003-12 |
CP Violation in B → PP Decays in the Standard Model with SU(3) Symmetry
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Shi, Jian-Qing; Hsiao, Yu-Kuo; He, Xiao-Gang; Fu, Han-Kuei; Fu, Han-Kuei; He, Xiao-Gang; Hsiao, Yu-Kuo; Shi, Jian-Qing |
Showing items 1-9 of 9 (1 Page(s) Totally)
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