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Institution Date Title Author
國立成功大學 2020-04-17 Structural evolution of in situ boron-doped SiGe ultrathin film analyzed by multi-optical methods Chang;Feng-Ming;Wu;Zong-Zhe;Chen;Yeh;Yen;Ting-Yu;Huang;Yu-Hsiang;Chong;Li-Yun;JangJian;Shiu-Ko;Lee;Fu-Ying;Chang;Yu-Ming;Lo;Kuang-Yao
國立成功大學 2017-10-12 The chemical states and atomic structure evolution of ultralow-energy high-dose Boron implanted Si(110) via laser annealing Lee;Fu-Ying;Wu;Zong-Zhe;Kao;Li-Chi;Chang;Feng-Mei;Chen;Sheng-Wen;JangJian;Shiu-Ko;Cheng;Hui-Yu;Chen;Wei-Liang;Chang;Yu-Ming;Lo;Yao, Kuang

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